Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 952
Book Description
Scientific and Technical Aerospace Reports
Parallel Processing
Author: Bruno Buchberger
Publisher: Springer Science & Business Media
ISBN: 9783540584308
Category : Computers
Languages : en
Pages : 918
Book Description
Proceedings -- Parallel Computing.
Publisher: Springer Science & Business Media
ISBN: 9783540584308
Category : Computers
Languages : en
Pages : 918
Book Description
Proceedings -- Parallel Computing.
Proceedings / Parcella 1988
Author: Gottfried Wolf
Publisher: Springer Science & Business Media
ISBN: 9783540506478
Category : Computers
Languages : en
Pages : 386
Book Description
Proceedings -- Parallel Computing.
Publisher: Springer Science & Business Media
ISBN: 9783540506478
Category : Computers
Languages : en
Pages : 386
Book Description
Proceedings -- Parallel Computing.
Annual Department of Defense Bibliography of Logistics Studies and Related Documents
Author: United States. Defense Logistics Studies Information Exchange
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 1120
Book Description
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 1120
Book Description
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
Author: Xiaowei Li
Publisher: Springer Nature
ISBN: 9811985510
Category : Computers
Languages : en
Pages : 318
Book Description
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
Publisher: Springer Nature
ISBN: 9811985510
Category : Computers
Languages : en
Pages : 318
Book Description
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
IBM Journal of Research and Development
Manufacturing Yield Evaluation of VLSI/WSI Systems
Author: Bruno Ciciani
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 452
Book Description
A practical understanding of these concepts and their application can help to reduce the chance of having device failures.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 452
Book Description
A practical understanding of these concepts and their application can help to reduce the chance of having device failures.
Design And Analysis Of Reliable And Fault-tolerant Computer Systems
Author: Mostafa I Abd-el-barr
Publisher: World Scientific
ISBN: 190897978X
Category : Computers
Languages : en
Pages : 463
Book Description
Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a
Publisher: World Scientific
ISBN: 190897978X
Category : Computers
Languages : en
Pages : 463
Book Description
Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a
Proceedings TENCON '93
Author: Baozong Yuan
Publisher:
ISBN:
Category : Automatic control
Languages : en
Pages : 634
Book Description
Publisher:
ISBN:
Category : Automatic control
Languages : en
Pages : 634
Book Description