Author: Carl W.P. Reuterswärd
Publisher: Springer
ISBN: 3662377705
Category : Science
Languages : en
Pages : 161
Book Description
XIth International Astronautical Congress Stockholm 1960 / XI. Internationaler Astronautischer Kongress / XIe Congrès International D’Astronautique
XIth International Astronautical Congress Stockholm 1960
Author: C.W.P. Reuterswärd
Publisher: Springer Science & Business Media
ISBN: 3709180716
Category : Technology & Engineering
Languages : en
Pages : 729
Book Description
Publisher: Springer Science & Business Media
ISBN: 3709180716
Category : Technology & Engineering
Languages : en
Pages : 729
Book Description
Svensk bokförteckning
XIth International Astronautical Congress Stockholm 1960
Author: Carl W. P. Reuterswärd
Publisher: Springer
ISBN: 9783642520204
Category : Science
Languages : en
Pages : 102
Book Description
Publisher: Springer
ISBN: 9783642520204
Category : Science
Languages : en
Pages : 102
Book Description
Determination of the Value of "e"
Author: John Yiu-bong Lee
Publisher:
ISBN:
Category : Electric charge and distribution
Languages : en
Pages : 26
Book Description
Publisher:
ISBN:
Category : Electric charge and distribution
Languages : en
Pages : 26
Book Description
Relativity
XIth International Astronautical Congress Stockholm 1960
Author: Carl W. P. Reuterswärd
Publisher: Springer Science & Business Media
ISBN: 3642520375
Category : Science
Languages : en
Pages : 106
Book Description
Publisher: Springer Science & Business Media
ISBN: 3642520375
Category : Science
Languages : en
Pages : 106
Book Description
Collected Mathematical Papers
Author: George David Birkhoff
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 824
Book Description
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 824
Book Description
Lunar Trajectories
Author: Richard J. Weber
Publisher:
ISBN:
Category : Guidance systems (Flight)
Languages : en
Pages : 72
Book Description
Publisher:
ISBN:
Category : Guidance systems (Flight)
Languages : en
Pages : 72
Book Description
X-Ray Spectrometry in Electron Beam Instruments
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461518253
Category : Science
Languages : en
Pages : 375
Book Description
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.
Publisher: Springer Science & Business Media
ISBN: 1461518253
Category : Science
Languages : en
Pages : 375
Book Description
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.