Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 754
Book Description
Comprehensive Dissertation Index
Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 754
Book Description
American Doctoral Dissertations
Author: Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 540
Book Description
Small-Angle Scattering of X-Rays
Author: Andre GuinierPublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 268
Book Description
Scientific and Technical Aerospace Reports
Author: Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1460
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Nuclear Science Abstracts
Author: Dissertation Abstracts International
Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 886
Book Description
Radiation in Bioanalysis
Author: Publisher:
ISBN: 9783030282486
Category : Electronic books
Languages : en
Pages :
Book Description
This book describes the state of the art across the broad range of spectroscopic techniques used in the study of biological systems. It reviews some of the latest advances achieved in the application of these techniques in the analysis and characterization of small and large biological compounds, covering topics such as VUV/UV and UV-visible spectroscopies, fluorescence spectroscopy, IR and Raman techniques, dynamic light scattering (DLS), circular dichroism (CD/SR-CD), pulsed electron paramagnetic resonance techniques, Mössbauer spectroscopy, nuclear magnetic resonance, X-ray methods and electron and ion impact spectroscopies. The second part of the book focuses on modelling methods and illustrates how these tools have been used and integrated with other experimental and theoretical techniques including also electron transfer processes and fast kinetics methods. The book will benefit students, researchers and professionals working with these techniques to understand the fundamental mechanisms of biological systems.
Energy Research Abstracts
Author: Optical Characterization of Epitaxial Semiconductor Layers
Author: Günther BauerPublisher: Springer Science & Business Media
ISBN: 3642796788
Category : Technology & Engineering
Languages : en
Pages : 446
Book Description
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore, the spatial and temporal resolution have been pushed to such limits that real time observation of surface processes during epitaxial growth is possible with techniques like reflectance difference spectroscopy. Of course, optical spectroscopies complement techniques based on the inter action of electrons with matter, but whereas the latter usually require high or ultrahigh vacuum conditions, the former ones can be applied in different environments as well. This advantage could turn out extremely important for a rather technological point of view, i.e. for the surveillance of modern semiconductor processes. Despite the large potential of techniques based on the interaction of electromagnetic waves with surfaces and epilayers, optical techniques are apparently moving only slowly into this area of technology. One reason for this might be that some prejudices still exist regarding their sensitivity.
Author: