Author: Gottfried MöllenstedtPublisher: Springer-Verlag
ISBN: 366224778X
Category : Science
Languages : de
Pages : 624
Book Description
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Author: Gottfried MöllenstedtPublisher: Springer-Verlag
ISBN: 366224778X
Category : Science
Languages : de
Pages : 624
Book Description
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongress Fur Rontgenoptik und Mikroanalyse / Ve Congres International Sur L'Optique Des Rayons X Et la Microanalyse
Author: Gottfried MollenstedtPublisher:
ISBN: 9783662121092
Category :
Languages : de
Pages : 628
Book Description
Vth International Congress on X-ray Optics and Microanalysis
Author: G. MöllenstedtPublisher:
ISBN:
Category : Microchemistry
Languages : de
Pages : 0
Book Description
German books in print
Author: Publisher:
ISBN:
Category : Catalogs, Publishers'
Languages : de
Pages : 1688
Book Description
X-Ray Optics and Microanalysis
Author: Robert OgilviePublisher:
ISBN: 9780895000125
Category :
Languages : en
Pages :
Book Description
Eighth International Congress on X-ray Optics and Microanalysis
Author: Donald Robert BeamanPublisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 665
Book Description
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Author: Gottfried MöllenstedtPublisher: Springer
ISBN: 9783540045717
Category : Science
Languages : de
Pages : 612
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
X-ray Optics and Microanalysis
Author: X-Ray Optics and X-Ray Microanalysis
Author: X-ray Optics and X-ray Microanalysis
Author: Vernon Ellis CosslettPublisher:
ISBN:
Category : Microradiography
Languages : en
Pages : 0
Book Description