Author:
Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 282
Book Description
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection II
Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection II
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819423115
Category : Engineering inspection
Languages : en
Pages : 262
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819423115
Category : Engineering inspection
Languages : en
Pages : 262
Book Description
Three-dimensional and Unconventional Imaging for Industrial Inspection and Metrology
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 436
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 436
Book Description
Three-dimensional Imaging, Optical Metrology, and Inspection
Author:
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 246
Book Description
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 246
Book Description
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection III
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
Three-dimensional Imaging, Optical Metrology, and Inspection IV
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 318
Book Description
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 318
Book Description
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
Three-dimensional Imaging, Optical Metrology, and Inspection V
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.