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Author: James Pawley Publisher: Springer Science & Business Media ISBN: 0387729720 Category : Science Languages : en Pages : 323
Book Description
Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. Although this imaging technique has undergone tremendous developments, it is still poorly represented in the literature, limited to journal articles and chapters in books. This comprehensive volume is dedicated to the theory and practical applications of FESEM in biological samples. It provides a comprehensive explanation of instrumentation, applications, and protocols, and is intended to teach the reader how to operate such microscopes to obtain the best quality images.
Author: James Pawley Publisher: Springer Science & Business Media ISBN: 0387729720 Category : Science Languages : en Pages : 323
Book Description
Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. Although this imaging technique has undergone tremendous developments, it is still poorly represented in the literature, limited to journal articles and chapters in books. This comprehensive volume is dedicated to the theory and practical applications of FESEM in biological samples. It provides a comprehensive explanation of instrumentation, applications, and protocols, and is intended to teach the reader how to operate such microscopes to obtain the best quality images.
Author: Weilie Zhou Publisher: Springer Science & Business Media ISBN: 0387396209 Category : Technology & Engineering Languages : en Pages : 533
Book Description
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author: Patrick Echlin Publisher: Springer Science & Business Media ISBN: 0387857311 Category : Technology & Engineering Languages : en Pages : 329
Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author: Peter W. Hawkes Publisher: Springer Nature ISBN: 3030000699 Category : Technology & Engineering Languages : en Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: Ray Egerton Publisher: Springer Science & Business Media ISBN: 9780387258003 Category : Technology & Engineering Languages : en Pages : 224
Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: Peter W. Hawkes Publisher: Academic Press ISBN: 1483284654 Category : Science Languages : en Pages : 654
Book Description
The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.
Author: James Robertson Publisher: CRC Press ISBN: 1439830711 Category : Law Languages : en Pages : 465
Book Description
In order for forensic fibre examiners to fully utilize fibre and textile evidence during their analysis, they require not only specialised forensic knowledge but also in-depth knowledge of fibres, yarns and fabrics themselves. Production, both the chemical and physical structure, and the properties of these materials is required in order to determine the value of fibre evidence. This includes knowing production figures, fashion changes, sudden arrivals of new materials, dye variability, and numerous other factors that may have a bearing on the information obtained. Fully updated with the latest advances, Forensic Examination of Fibres, Third Edition continues in the tradition of the First (1992) and Second Editions (1999) as the premier text on the subject of forensic fibre analysis. The international team of contributing authors detail the recovery of the evidence—through the different stages of laboratory examination—to the evaluation of the meaning of findings. The coverage has been considerably expanded, and all material, has been revised and wholly updated. Topics covered include examining damaged textiles, infrared microspectroscopy and thin layer chomatography, and colour analyses. This edition also highlights the critical role of quality assurance in ensuring the reliability of the technical observations and results, and, in doing so, looks at the implications of supervisory managers and labs in the accurate and responsible analysis of such evidence. Features include: Outlining evidentiary process from collecting and preserving the evidence at the crime scene through the laboratory analysis of fibres Detailing the latest developments and emerging technologies including Kevlar and other such advances in fibre technology Coverage of a broad array of fibres both, natural (cellulose, protein, and mineral) and man-made fibres including synthetic, inorganic and regenerated Forensic Examination of Fibres, Third Edition is a much-needed update to the classic book, serving as an indispensable reference to crime scene technicians, laboratory forensic scientists and microscopists, students in police, forensic, and justice science programs.
Author: James Pawley
Author: James Pawley
Author: M. A. Hayat
Author: 
Author: Weilie Zhou
Author: Patrick Echlin
Author: Peter W. Hawkes
Author: Ray Egerton
Author: Peter W. Hawkes
Author: James Robertson
Author: