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Author: Richard L. Meehan Publisher: MIT Press ISBN: 9780262131995 Category : History Languages : en Pages : 190
Book Description
With wit and thoughtful compassion, Richard Meehan presents one of the most perplexing of contemporary moral predicaments, one that arises in every attempt to assess potentially hazardous technologies. He focuses on the longrunning controversy over suspected earthquake faults near the nation's first corporately owned nuclear test reactor at Vallecitos, California, and uses this account of "the politics of expertise" to probe the nature of scientific truth and its relationship to the determination of public safety. At Vallecitos, Meehan points out, the opinions of the "experts" were radically divided. Where one group saw clear and ominous evidence of an earthquake fault in trenches dug at this showpiece site, others saw only the mark of an ancient landslide. How did these experts arrive at their opinions? Were they simply representing corporate, as opposed to environmentalist, points of view? And how are the public regulatory agencies charged with deciding such issues supposed to balance these seemingly irreconcilable opinions? The Atom and the Faultexplores these crucial questions as the issue of the earthquake safety of nuclear power plants continues to grow into a struggle encompassing government regulatory bodies, public utilities, private industry, engineers, geologists, and citizen activists. It paints candid portraits of the principal expert players, clarifies the difficult and often delicate interplay of honesty and loyalties among them, and lucidly explains the technical issues and viewpoints involved. As a professional participant in several environmental controversies in which so-called scientific facts were represented by opposing points of view, Meehan is uniquely qualified to tell this tale. He is a consultant to industry, government agencies, and law firms specializing in forecasting and damage assessment related to earthquakes and land failures, and an adjunct professor in the Values, Technology, Science, and Society program at Stanford University. His first book, Getting Sued and Other Tales of the Engineering Life was published by The MIT Press in 1981.
Author: Richard L. Meehan Publisher: MIT Press ISBN: 9780262131995 Category : History Languages : en Pages : 190
Book Description
With wit and thoughtful compassion, Richard Meehan presents one of the most perplexing of contemporary moral predicaments, one that arises in every attempt to assess potentially hazardous technologies. He focuses on the longrunning controversy over suspected earthquake faults near the nation's first corporately owned nuclear test reactor at Vallecitos, California, and uses this account of "the politics of expertise" to probe the nature of scientific truth and its relationship to the determination of public safety. At Vallecitos, Meehan points out, the opinions of the "experts" were radically divided. Where one group saw clear and ominous evidence of an earthquake fault in trenches dug at this showpiece site, others saw only the mark of an ancient landslide. How did these experts arrive at their opinions? Were they simply representing corporate, as opposed to environmentalist, points of view? And how are the public regulatory agencies charged with deciding such issues supposed to balance these seemingly irreconcilable opinions? The Atom and the Faultexplores these crucial questions as the issue of the earthquake safety of nuclear power plants continues to grow into a struggle encompassing government regulatory bodies, public utilities, private industry, engineers, geologists, and citizen activists. It paints candid portraits of the principal expert players, clarifies the difficult and often delicate interplay of honesty and loyalties among them, and lucidly explains the technical issues and viewpoints involved. As a professional participant in several environmental controversies in which so-called scientific facts were represented by opposing points of view, Meehan is uniquely qualified to tell this tale. He is a consultant to industry, government agencies, and law firms specializing in forecasting and damage assessment related to earthquakes and land failures, and an adjunct professor in the Values, Technology, Science, and Society program at Stanford University. His first book, Getting Sued and Other Tales of the Engineering Life was published by The MIT Press in 1981.
Author: J. Samuel Walker Publisher: Univ of California Press ISBN: 9780520079137 Category : History Languages : en Pages : 548
Book Description
The late 1960s saw an extraordinary growth in the American nuclear industry: dozens of plants of unprecedented size were ordered throughout the country. Yet at the same time, public concern about the natural environment and suspicion of both government and industry increased dramatically. Containing the Atom is the first scholarly history of nuclear power regulation during those tumultuous years. J. Samuel Walker focuses on the activities of the U.S. Atomic Energy Commission, the agency entrusted with the primary responsibility for the safety of nuclear power, and shows that from the beginning the AEC faced a paradox: it was charged with both promoting and controlling the nuclear power industry. Out of this paradox grew severe tensions, which Walker discusses in detail. His balanced evaluation of the issues and the positions taken by the AEC and others makes this study an invaluable resource for all those interested in the continuing controversies that surround nuclear energy. The late 1960s saw an extraordinary growth in the American nuclear industry: dozens of plants of unprecedented size were ordered throughout the country. Yet at the same time, public concern about the natural environment and suspicion of both government and industry increased dramatically. Containing the Atom is the first scholarly history of nuclear power regulation during those tumultuous years. J. Samuel Walker focuses on the activities of the U.S. Atomic Energy Commission, the agency entrusted with the primary responsibility for the safety of nuclear power, and shows that from the beginning the AEC faced a paradox: it was charged with both promoting and controlling the nuclear power industry. Out of this paradox grew severe tensions, which Walker discusses in detail. His balanced evaluation of the issues and the positions taken by the AEC and others makes this study an invaluable resource for all those interested in the continuing controversies that surround nuclear energy.
Author: Philip L. Cantelon Publisher: University of Pennsylvania Press ISBN: 9780812213546 Category : History Languages : en Pages : 396
Book Description
For this edition (first in 1984), the editors have updated the collection of primary documents which tell the story of atomic energy in the US from the discovery of fission through the development of nuclear weapons, international proliferation, and attempts at control. The book also includes a new chapter, reflects on Chernoyl, Annotation copyrighted by Book News, Inc., Portland, OR
Author: Peter M. Anderson Publisher: Cambridge University Press ISBN: 1316785106 Category : Technology & Engineering Languages : en Pages : 721
Book Description
Theory of Dislocations provides unparalleled coverage of the fundamentals of dislocation theory, with applications to specific metal and ionic crystals. Rather than citing final results, step-by-step developments are provided to offer an in-depth understanding of the topic. The text provides the solid theoretical foundation for researchers to develop modeling and computational approaches to discrete dislocation plasticity, yet it covers important experimental observations related to the effects of crystal structure, temperature, nucleation mechanisms, and specific systems. This new edition incorporates significant advances in theory, experimental observations of dislocations, and new findings from first principles and atomistic treatments of dislocations. Also included are new discussions on thin films, deformation in nanostructured systems, and connection to crystal plasticity and strain gradient continuum formulations. Several new computer programs and worked problems allow the reader to understand, visualize, and implement dislocation theory concepts.
Author: Valerio Pascucci Publisher: Springer Science & Business Media ISBN: 3642150144 Category : Mathematics Languages : en Pages : 265
Book Description
Topology-based methods are of increasing importance in the analysis and visualization of datasets from a wide variety of scientific domains such as biology, physics, engineering, and medicine. Current challenges of topology-based techniques include the management of time-dependent data, the representation of large and complex datasets, the characterization of noise and uncertainty, the effective integration of numerical methods with robust combinatorial algorithms, etc. . The editors have brought together the most prominent and best recognized researchers in the field of topology-based data analysis and visualization for a joint discussion and scientific exchange of the latest results in the field. This book contains the best 20 peer-reviewed papers resulting from the discussions and presentations at the third workshop on "Topological Methods in Data Analysis and Visualization", held 2009 in Snowbird, Utah, US. The 2009 "TopoInVis" workshop follows the two successful workshops in 2005 (Slovakia) and 2007 (Germany).
Author: Ashok K. Batra Publisher: Mahi Publication ISBN: 811949265X Category : Antiques & Collectibles Languages : en Pages : 76
Book Description
Thin films have significantly impacted the present modern era of technology and are considered the backbone of advanced applications in various fields, such as optical devices, environmental applications, telecommunications devices, energy storage, photovoltaic solar cells, integrated circuits, and others. The critical issue for all applications of thin films depends on their morphology and stability. The morphology of thin films strongly depends on the deposition techniques. Hence due to its multidisciplinary nature, a background in thin film technology requires skills such as chemistry, physics, electrical engineering, and materials science and engineering
Author: Alexander J. Pertsin Publisher: Springer Science & Business Media ISBN: 3642827128 Category : Science Languages : en Pages : 404
Book Description
The history of physics furnishes many examples of how a simple semiem pirical method, essentially based on intuitive considerations, may prove to be much more successful than a rigorous theoretical approach. A pertinent example is the method of atom-atom potentials, which treats the intermolec ular interactions between polyatomic molecules in terms of pairwise inter actions between their constituent atoms. Despite a few conceptual short comings, the method provides a fairly reliable practical means of handling, on a microscopic level, a wide range of problems that arise in the solid-state physics and chemistry of organic compounds. This monograph is an attempt to generalize the experience gained in the past twenty years in interpreting the static and dynamic properties of organic molecular solids in terms of atom-atom potentials. It embraces nearly all aspects of the application of the method, including an evaluation of cohesive energies, equilibrium crystal structures, phonon spectra, ther modynamic functions, and crystal defects. Many related topics such as the effect of the crystal field on molecular conformation, the determination of crystal structures from raw diffraction data, and the problem of polymor phic transitions are also discussed. We believe that this book will be of use to researchers in solid-state physics, chemistry, crystallography, physical chemistry, and polymer chem istry. It also gives us an opportunity to acknowledge our indebtedness to those who sent us published as well as unpublished information and sugges tions, including A.T. Amos, E.L. Bokhenkov, H. Bonadeo, R.K. Boyd, C.P.
Author: Yonghui Deng Publisher: Springer ISBN: 9811358532 Category : Technology & Engineering Languages : en Pages : 253
Book Description
This book focuses on the use of semiconducting metal oxides as gas sensing materials, including the sensing mechanism and sensing materials modification approach, while also providing a comprehensive introduction to semiconductor gas sensing devices. As an essential part of IoT (Internet of things), gas sensors have shown great significance and promising prospects. Therefore, studies on semiconducting metal oxides, one of the most important gas sensing materials, have increasingly attracted attention from various disciplines. The book offers a valuable reference guide to metal oxide gas sensing materials for undergraduate and graduate students alike. It will also benefit all researchers who investigate metal oxides nanomaterials synthesis and gas sensing with relevant frontier theories and concepts. Engineers working on research and development for semiconductor gas sensors will also find new ideas in sensor design.
Author: Reinhard B. Neder Publisher: OUP Oxford ISBN: 0191552801 Category : Science Languages : en Pages : 240
Book Description
In recent years it has become apparent that knowing the average atomic structure of materials is insufficient to understand their properties. Diffuse scattering in addition to the Bragg scattering holds the key to learning about defects in materials, the topic of many recent books. What has been missing is a detailed step-by-step guide how to simulate disordered materials. The DISCUS cook book fills this need covering simple topics such as building a computer crystal to complex topic such as domain structures, stacking faults or using advanced refinement techniques to adjust parameters on a disordered model. The book contains a CDROM with all files needed to recreate every example given using the program DISCUS. The reader is free to follow the principles behind simulating disordered materials or to get down into the details and run or modify the given examples.
Author: Richard L. Meehan
Author: Richard L. Meehan
Author: J. Samuel Walker
Author: Philip L. Cantelon
Author: John Sydney Blakemore
Author: Peter M. Anderson
Author: Valerio Pascucci
Author: Ashok K. Batra
Author: Alexander J. Pertsin
Author: Yonghui Deng
Author: Reinhard B. Neder