The Aberrations of a Quadrupole Quadruplet Projector PDF Download

Author: Kirby Gannett Vosburgh
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 244

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Author: Martin Hÿtch
Publisher: Academic Press
ISBN: 0323988660
Category : Technology & Engineering
Languages : en
Pages : 400

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Book Description
Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series - Updated release includes the latest information on Coulomb Interactions in Particle Beams

Author: O. Klemperer
Publisher: Cambridge University Press
ISBN: 0521079284
Category : Science
Languages : en
Pages : 526

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Book Description
This 1971 third edition of Dr Klemperer's Electron Optics is concerned primarily with the experimental aspects of electron optics.

Author: Harald Rose
Publisher: Springer
ISBN: 3642321194
Category : Science
Languages : en
Pages : 519

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Book Description
This second edition is an extended version of the first edition of Geometrical Charged-Particle Optics. The updated reference monograph is intended as a guide for researchers and graduate students who are seeking a comprehensive treatment of the design of instruments and beam-guiding systems of charged particles and their propagation in electromagnetic fields. Wave aspects are included in this edition for explaining electron holography, the Aharanov-Bohm effect and the resolution of electron microscopes limited by diffraction. Several methods for calculating the electromagnetic field are presented and procedures are outlined for calculating the properties of systems with arbitrarily curved axis. Detailed methods are presented for designing and optimizing special components such as aberration correctors, spectrometers, energy filters monochromators, ion traps, electron mirrors and cathode lenses. In particular, the optics of rotationally symmetric lenses, quadrupoles, and systems composed of these elements are discussed extensively. Beam properties such as emittance, brightness, transmissivity and the formation of caustics are outlined. Relativistic motion and spin precession of the electron are treated in a covariant way by introducing the Lorentz-invariant universal time and by extending Hamilton’s principle from three to four spatial dimensions where the laboratory time is considered as the fourth pseudo-spatial coordinate. Using this procedure and introducing the self action of the electron, its accompanying electromagnetic field and its radiation field are calculated for arbitrary motion. In addition, the Stern-Gerlach effect is revisited for atomic and free electrons.

Author: Jon Orloff
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666

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Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Author: Harald H. Rose
Publisher: Springer Science & Business Media
ISBN: 3540859152
Category : Science
Languages : en
Pages : 422

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Book Description
This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.

Author:
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 212

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Author: Nichigai Asoshiētsu
Publisher:
ISBN:
Category : Applied physics letters
Languages : en
Pages : 1272

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Author: Electron Microscopy Society of America
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 408

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Author: National Institutes of Health (U.S.). Division of Research Grants
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 756

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Book Description