Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 512

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Book Description

Author: Josef Lutz
Publisher: Springer
ISBN: 3319709178
Category : Technology & Engineering
Languages : en
Pages : 723

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Book Description
Halbleiter-Leistungsbauelemente sind das Kernstück der Leistungselektronik. Sie bestimmen die Leistungsfähigkeit und machen neuartige und verlustarme Schaltungen erst möglich. In dem Band wird neben den Halbleiter-Leistungsbauelementen selbst auch die Aufbau- und Verbindungstechnik behandelt: von den physikalischen Grundlagen und der Herstellungstechnologie über einzelne Bauelemente bis zu thermomechanischen Problemen, Zerstörungsmechanismen und Störungseffekten. Die 2., überarbeitete Auflage berücksichtigt technische Neuerungen und Entwicklungen.

Author: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 9780470516164
Category : Technology & Engineering
Languages : en
Pages : 472

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Book Description
Interest in latchup is being renewed with the evolution of complimentary metal-oxide semiconductor (CMOS) technology, metal-oxide-semiconductor field-effect transistor (MOSFET) scaling, and high-level system-on-chip (SOC) integration. Clear methodologies that grant protection from latchup, with insight into the physics, technology and circuit issues involved, are in increasing demand. This book describes CMOS and BiCMOS semiconductor technology and their sensitivity to present day latchup phenomena, from basic over-voltage and over-current conditions, single event latchup (SEL) and cable discharge events (CDE), to latchup domino phenomena. It contains chapters focusing on bipolar physics, latchup theory, latchup and guard ring characterization structures, characterization testing, product level test systems, product level testing and experimental results. Discussions on state-of-the-art semiconductor processes, design layout, and circuit level and system level latchup solutions are also included, as well as: latchup semiconductor process solutions for both CMOS to BiCMOS, such as shallow trench, deep trench, retrograde wells, connecting implants, sub-collectors, heavily-doped buried layers, and buried grids – from single- to triple-well CMOS; practical latchup design methods, automated and bench-level latchup testing methods and techniques, latchup theory of logarithm resistance space, generalized alpha (a) space, beta (b) space, new latchup design methods– connecting the theoretical to the practical analysis, and; examples of latchup computer aided design (CAD) methodologies, from design rule checking (DRC) and logical-to-physical design, to new latchup CAD methodologies that address latchup for internal and external latchup on a local as well as global design level. Latchup acts as a companion text to the author’s series of books on ESD (electrostatic discharge) protection, serving as an invaluable reference for the professional semiconductor chip and system-level ESD engineer. Semiconductor device, process and circuit designers, and quality, reliability and failure analysis engineers will find it informative on the issues that confront modern CMOS technology. Practitioners in the automotive and aerospace industries will also find it useful. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, computer aided design and design integration.

Author: An Chen
Publisher: John Wiley & Sons
ISBN: 1119869609
Category : Technology & Engineering
Languages : en
Pages : 372

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Book Description
Advances in Semiconductor Technologies Discover the broad sweep of semiconductor technologies in this uniquely curated resource Semiconductor technologies and innovations have been the backbone of numerous different fields: electronics, online commerce, the information and communication industry, and the defense industry. For over fifty years, silicon technology and CMOS scaling have been the central focus and primary driver of innovation in the semiconductor industry. Traditional CMOS scaling has approached some fundamental limits, and as a result, the pace of scientific research and discovery for novel semiconductor technologies is increasing with a focus on novel materials, devices, designs, architectures, and computer paradigms. In particular, new computing paradigms and systems—such as quantum computing, artificial intelligence, and Internet of Things—have the potential to unlock unprecedented power and application space. Advances in Semiconductor Technologies provides a comprehensive overview of selected semiconductor technologies and the most up-to-date research topics, looking in particular at mainstream developments in current industry research and development, from emerging materials and devices, to new computing paradigms and applications. This full-coverage volume gives the reader valuable insights into state-of-the-art advances currently being fabricated, a wide range of novel applications currently under investigation, and a glance into the future with emerging technologies in development. Advances in Semiconductor Technologies readers will also find: A comprehensive approach that ensures a thorough understanding of state-of-the-art technologies currently being fabricated Treatments on all aspects of semiconductor technologies, including materials, devices, manufacturing, modeling, design, architecture, and applications Articles written by an impressive team of international academics and industry insiders that provide unique insights into a wide range of topics Advances in Semiconductor Technologies is a useful, time-saving reference for electrical engineers working in industry and research, who are looking to stay abreast of rapidly advancing developments in semiconductor electronics, as well as academics in the field and government policy advisors.

Author: Shahriyar Kaboli
Publisher: John Wiley & Sons
ISBN: 1119772184
Category : Technology & Engineering
Languages : en
Pages : 388

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Book Description
Resilient Power Electronic Systems Discover an advanced reference offering a powerful novel approach to the design and use of reliable and fault-tolerant power electronic systems In Resilient Power Electronic Systems, a team of accomplished researchers deliver an insightful treatment of the challenges faced by practitioners and researchers working with power electronic converters and attempting to analyze internal and external failure mechanisms. The authors expertly present advanced techniques for reducing noise effects on fault detection and prognosis. Comprised of thirteen chapters, the authors discuss the concepts of resilience and effective operative life in the context of power electronics. The differences between reliable and efficient systems are discussed, as well as the nature of these differences in complex systems. Finally, the book explores various methods to improve the resilience of power converters. Resilient Power Electronic Systems is packed with features, including illustrations, practice problems, and PowerPoint presentations. The book also includes: A thorough introduction to the application of power electronics in various industries, as well as the concept of resilience in a power converter Comprehensive explorations of resilience against fault tolerance, including fault-tolerant power converters and resilient power converters Practical discussions of the state-of-the-art in resilient power converters, including examinations of mission-critical applications In-depth examinations of internal and external fault in power converters with mission-critical applications Resilient Power Electronic Systems is an indispensable resource for researchers, professionals, and postgraduate students studying power electronics. It’s also an ideal reference for research and development engineers working with the design and development of power electronic converters.

Author: Toni López
Publisher: Springer Science & Business Media
ISBN: 1441975608
Category : Technology & Engineering
Languages : en
Pages : 421

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Book Description
This book deals with energy delivery challenges of the power processing unit of modern computer microprocessors. It describes in detail the consequences of current trends in miniaturization and clock frequency increase, upon the power delivery unit, referred to as voltage regulator. This is an invaluable reference for anybody needing to understand the key performance limitations and opportunities for improvement, from both a circuit and systems perspective, of state-of-the-art power solutions for next generation CPUs.

Author: Pietro Buccella
Publisher: Springer
ISBN: 3319743821
Category : Technology & Engineering
Languages : en
Pages : 195

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Book Description
This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools. The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching devices besides sensitive control, protection and signal processing circuits. The injection of parasitic charges leads to the activation of substrate bipolar transistors. This book explores how these events can be evaluated for a wide range of circuit topologies. To this purpose, new generalized devices implemented in Verilog-A are used to model the substrate with standard circuit simulators. This approach was able to predict for the first time the activation of a latch-up in real circuits through post-layout SPICE simulation analysis. Discusses substrate modeling and circuit-level simulation of parasitic bipolar device coupling effects in integrated circuits; Includes circuit back-annotation of the parasitic lateral n-p-n and vertical p-n-p bipolar transistors in the substrate; Uses Spice for simulation and characterization of parasitic bipolar transistors, latch-up of the parasitic p-n-p-n structure, and electrostatic discharge (ESD) protection devices; Offers design guidelines to reduce couplings by adding specific protections.

Author: Yukinobu Kumashiro
Publisher: CRC Press
ISBN: 9780203908181
Category : Technology & Engineering
Languages : en
Pages : 778

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Book Description
An exploration of electric refractory materials, this book covers developments of blue light-emitting diodes using GaN-based nitrides for laser and high-temperature and -frequency devices. Electric Refractory Materials introduces growth and evaluation standards of films and bulk crystals, with consideration of band structure, surface electronic structure, and lattice vibrations. It also covers heat capacity and thermal conductivity, irradiation properties, and selective surfaces. Focusing on diamond material, the book examines its synthesis and characterization as well as its electrical, optical, and conductive properties. The book also discusses the use of silicon carbide, boron compounds, and other material used in electronic and light-emitting devices.

Author: Xiong Du
Publisher: Springer Nature
ISBN: 9811931321
Category : Technology & Engineering
Languages : en
Pages : 184

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Book Description
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.

Author: Teen-Hang Meen
Publisher: MDPI
ISBN: 303928973X
Category : Technology & Engineering
Languages : en
Pages : 220

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Book Description
In a modern technological society, electronic engineering and design innovations are both academic and practical engineering fields that involve systematic technological materialization through scientific principles and engineering designs. Engineers and designers must work together with a variety of other professionals in their quest to find systems solutions to complex problems. Rapid advances in science and technology have broadened the horizons of engineering while simultaneously creating a multitude of challenging problems in every aspect of modern life. Current research is interdisciplinary in nature, reflecting a combination of concepts and methods that often span several areas of mechanics, mathematics, electrical engineering, control engineering, and other scientific disciplines. In addition, the 2nd IEEE International Conference on Knowledge Innovation and Invention 2019 (IEEE ICKII 2019) was held in Seoul, South Korea, on 12–15 July, 2019. This book, “Intelligent Electronic Devices”, includes 13 excellent papers form 260 papers presented in this conference about intelligent electronic devices. The main goals of this book were to encourage scientists to publish their experimental and theoretical results in as much detail as possible and to provide new scientific knowledge relevant to the topics of electronics.