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Author: Gerard Meszaros Publisher: Pearson Education ISBN: 0132797461 Category : Computers Languages : en Pages : 890
Book Description
Automated testing is a cornerstone of agile development. An effective testing strategy will deliver new functionality more aggressively, accelerate user feedback, and improve quality. However, for many developers, creating effective automated tests is a unique and unfamiliar challenge. xUnit Test Patterns is the definitive guide to writing automated tests using xUnit, the most popular unit testing framework in use today. Agile coach and test automation expert Gerard Meszaros describes 68 proven patterns for making tests easier to write, understand, and maintain. He then shows you how to make them more robust and repeatable--and far more cost-effective. Loaded with information, this book feels like three books in one. The first part is a detailed tutorial on test automation that covers everything from test strategy to in-depth test coding. The second part, a catalog of 18 frequently encountered "test smells," provides trouble-shooting guidelines to help you determine the root cause of problems and the most applicable patterns. The third part contains detailed descriptions of each pattern, including refactoring instructions illustrated by extensive code samples in multiple programming languages.
Author: Gerard Meszaros Publisher: Pearson Education ISBN: 0132797461 Category : Computers Languages : en Pages : 890
Book Description
Automated testing is a cornerstone of agile development. An effective testing strategy will deliver new functionality more aggressively, accelerate user feedback, and improve quality. However, for many developers, creating effective automated tests is a unique and unfamiliar challenge. xUnit Test Patterns is the definitive guide to writing automated tests using xUnit, the most popular unit testing framework in use today. Agile coach and test automation expert Gerard Meszaros describes 68 proven patterns for making tests easier to write, understand, and maintain. He then shows you how to make them more robust and repeatable--and far more cost-effective. Loaded with information, this book feels like three books in one. The first part is a detailed tutorial on test automation that covers everything from test strategy to in-depth test coding. The second part, a catalog of 18 frequently encountered "test smells," provides trouble-shooting guidelines to help you determine the root cause of problems and the most applicable patterns. The third part contains detailed descriptions of each pattern, including refactoring instructions illustrated by extensive code samples in multiple programming languages.
Author: Marjorie Klein Publisher: Harper Perennial ISBN: 9780060959531 Category : Fiction Languages : en Pages : 288
Book Description
When a new TV set arrives in the Palmer household in Newport News, Virginia, in 1954, change is in the wind. Eleven-year-old Cassie discovers that she--and only she -- can see glimpses of the future within the hypnotic test pattern: snippets from President Kennedy's assassination, the landing on the moon, the O.J. Simpson trial. Meanwhile, her family goes haywire. Her mother decides to pursue her dream of becoming a famous tap dancer, while her shipyard-worker father plunges into depression. Brilliantly re-creating the innocence and energy of that time, this magical tale offers a witty reflection on the troubled path to fame, a child's awakening to the world, and the tangled web of the family.
Author: Stephan Eggersglüß Publisher: Springer Science & Business Media ISBN: 1441999760 Category : Technology & Engineering Languages : en Pages : 208
Book Description
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
Author: Ireneusz Mrozek Publisher: Springer ISBN: 3319912046 Category : Technology & Engineering Languages : en Pages : 142
Book Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Author: Nisar Ahmed Publisher: Springer Science & Business Media ISBN: 0387757287 Category : Technology & Engineering Languages : en Pages : 288
Book Description
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Author: Vladimir Khorikov Publisher: Simon and Schuster ISBN: 1638350299 Category : Computers Languages : en Pages : 460
Book Description
"This book is an indispensable resource." - Greg Wright, Kainos Software Ltd. Radically improve your testing practice and software quality with new testing styles, good patterns, and reliable automation. Key Features A practical and results-driven approach to unit testing Refine your existing unit tests by implementing modern best practices Learn the four pillars of a good unit test Safely automate your testing process to save time and money Spot which tests need refactoring, and which need to be deleted entirely Purchase of the print book includes a free eBook in PDF, Kindle, and ePub formats from Manning Publications. About The Book Great testing practices maximize your project quality and delivery speed by identifying bad code early in the development process. Wrong tests will break your code, multiply bugs, and increase time and costs. You owe it to yourself—and your projects—to learn how to do excellent unit testing. Unit Testing Principles, Patterns and Practices teaches you to design and write tests that target key areas of your code including the domain model. In this clearly written guide, you learn to develop professional-quality tests and test suites and integrate testing throughout the application life cycle. As you adopt a testing mindset, you’ll be amazed at how better tests cause you to write better code. What You Will Learn Universal guidelines to assess any unit test Testing to identify and avoid anti-patterns Refactoring tests along with the production code Using integration tests to verify the whole system This Book Is Written For For readers who know the basics of unit testing. Examples are written in C# and can easily be applied to any language. About the Author Vladimir Khorikov is an author, blogger, and Microsoft MVP. He has mentored numerous teams on the ins and outs of unit testing. Table of Contents: PART 1 THE BIGGER PICTURE 1 ¦ The goal of unit testing 2 ¦ What is a unit test? 3 ¦ The anatomy of a unit test PART 2 MAKING YOUR TESTS WORK FOR YOU 4 ¦ The four pillars of a good unit test 5 ¦ Mocks and test fragility 6 ¦ Styles of unit testing 7 ¦ Refactoring toward valuable unit tests PART 3 INTEGRATION TESTING 8 ¦ Why integration testing? 9 ¦ Mocking best practices 10 ¦ Testing the database PART 4 UNIT TESTING ANTI-PATTERNS 11 ¦ Unit testing anti-patterns
Author: Parag K. Lala Publisher: Springer Nature ISBN: 303179785X Category : Technology & Engineering Languages : en Pages : 99
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Gerard Meszaros
Author: Gerard Meszaros
Author: Marjorie Klein
Author: Stephan Eggersglüß
Author: Martin G. Buehler
Author: William E. Ham
Author: Ireneusz Mrozek
Author: Nisar Ahmed
Author: Vladimir Khorikov
Author: Byungse So
Author: Parag K. Lala