Scientific and Technical Aerospace Reports PDF Download

Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 562

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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1736

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Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 0387857311
Category : Technology & Engineering
Languages : en
Pages : 329

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Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Author:
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 1220

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Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.

Author: Debbie Stokes
Publisher: John Wiley & Sons
ISBN: 0470065400
Category : Science
Languages : en
Pages : 247

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Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk

Author:
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ISBN:
Category : Nuclear energy
Languages : en
Pages : 1394

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Author: Yves Arden
Publisher: Routledge
ISBN: 1134831633
Category : Reference
Languages : en
Pages : 866

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The French-English volume of this highly acclaimed set consists of some 100,000 keywords in both French and English, drawn from the whole range of modern applied science and technical terminology. Covers over 70 subject areas, from engineering and chemistry to packaging, transportation, data processing and much more.

Author: Xenia Klinger
Publisher:
ISBN: 9780662191384
Category : City planning
Languages : en
Pages : 79

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Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 0387881360
Category : Technology & Engineering
Languages : en
Pages : 406

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Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.

Author: Abdelkhalak El Hami
Publisher: Elsevier
ISBN: 0081024231
Category : Technology & Engineering
Languages : en
Pages : 305

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Book Description
This second volume of a series dedicated to the reliability of high-power mechatronic systems focuses specifically on issues, testing and analysis in automotive and aerospace applications. In the search to improve industrial competitiveness, the development of methods and tools for the design of products is especially pertinent in the context of cost reduction. This book proposes new methods that simultaneously allow for a quicker design of future mechatronic devices in the automotive and aerospace industries while guaranteeing their increased reliability. The reliability of these critical elements is further validated digitally through new multi-physical and probabilistic models that could ultimately lead to new design standards and reliable forecasting. - Presents a methodological guide that demonstrates the reliability of fractured mechatronic components and devices - Includes numerical and statistical models to optimize the reliability of the product architecture - Develops a methodology to characterize critical elements at the earliest stage in their development