Author: Publisher:
ISBN:
Category : Metrology
Languages : en
Pages :
Book Description
Test and Measurement Conference 2002
Author: Test and measurement conference 2002
Author: Test and Measurement ConferencePublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Digital Timing Measurements
Author: Wolfgang MaichenPublisher: Springer Science & Business Media
ISBN: 0387314199
Category : Technology & Engineering
Languages : en
Pages : 250
Book Description
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this field an engineer needs to understand instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. This book gives a compact, practice-oriented overview on all these subjects with emphasis on useable concepts and real-life guidelines.
Proceedings
Author: IeeePublisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769521343
Category : Technology & Engineering
Languages : en
Pages : 468
Book Description
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Proceedings of the ... IEEE Instrumentation and Measurement Technology Conference
Author: Publisher:
ISBN:
Category : Electronic instruments
Languages : en
Pages : 874
Book Description
Index of Conference Proceedings
Author: British Library. Document Supply CentrePublisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 870
Book Description
Dynamic Assessment, Intelligence and Measurement
Author: Raegan MurphyPublisher: John Wiley & Sons
ISBN: 0470977493
Category : Psychology
Languages : en
Pages : 296
Book Description
Dynamic Assessment, Intelligence and Measurement paves the way for the development of dynamic assessment by applying this unique approach to the assessment of human potential. Explores the relationship that dynamic assessment shares with intelligence and measurement Outlines a new approach to the assessment of human intelligence while remaining rooted within the scientific realm of psychology Fuses philosophy, science methodology, and meta-theory to offer an innovative framework for the assessment of models and theories, dynamic assessment, intelligence, measurement theory, and statistical significance testing Provides the theoretical underpinnings that can lead to a new way forward for the 'movement' of dynamic assessment
Proceedings of the Third International Network Conference (INC2002)
Author: Paul DowlandPublisher: Lulu.com
ISBN: 1841021059
Category : Computers
Languages : en
Pages : 640
Book Description
This book contains the proceedings of the Third International Network Conference (INC 2002), which was held in Plymouth, UK, in July 2002. A total of 72 papers were accepted for inclusion in the conference, and they are presented here in 8 themed chapters. The main topics of the book include: Web Technologies and Applications; Network Technologies; Multimedia over IP; Quality of Service; Security and Privacy; Distributed Technologies; Mobility; and Applications and Impacts. The papers address state-of-the-art research and applications of network technology, arising from both the academic and industrial domains. The book should consequently be of interest to network practitioners, researchers, academics, and technical managers involved in the design, development and use of network systems.
An Engineer's Guide to Automated Testing of High-speed Interfaces
Author: José MoreiraPublisher: Artech House
ISBN: 1607839849
Category : Automatic test equipment
Languages : en
Pages : 591
Book Description
Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses at advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.
Author: