X-ray and Electron Diffraction Studies in Materials Science PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download X-ray and Electron Diffraction Studies in Materials Science PDF full book. Access full book title X-ray and Electron Diffraction Studies in Materials Science by David John Dyson. Download full books in PDF and EPUB format.
Author: David John Dyson Publisher: Routledge ISBN: Category : Science Languages : en Pages : 382
Book Description
This text is to addresses the requirements of the analyst working in a materials laboratory from a practical angle providing reference where necessary to more detailed work. It also shows the link between XRD and other analytical techniques with integral diffraction facilities. Some applications are briefly discussed to show what can be achieved; others to show what to look for and what to check. The provision of computing facilities, while having many benefits, can also lead to a false reliance in the output that they generate. The importance of the errors that can occur, how to handle them and the need to provide some measure of uncertainty to the customer are considered. It does not purport to be universal in its coverage.
Author: David John Dyson Publisher: Routledge ISBN: Category : Science Languages : en Pages : 382
Book Description
This text is to addresses the requirements of the analyst working in a materials laboratory from a practical angle providing reference where necessary to more detailed work. It also shows the link between XRD and other analytical techniques with integral diffraction facilities. Some applications are briefly discussed to show what can be achieved; others to show what to look for and what to check. The provision of computing facilities, while having many benefits, can also lead to a false reliance in the output that they generate. The importance of the errors that can occur, how to handle them and the need to provide some measure of uncertainty to the customer are considered. It does not purport to be universal in its coverage.
Author: Brent Fultz Publisher: Springer Science & Business Media ISBN: 3642297609 Category : Science Languages : en Pages : 775
Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author: Joseph Goldstein Publisher: Springer Science & Business Media ISBN: 1461332737 Category : Science Languages : en Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: Xiaodong Zou Publisher: Oxford University Press ISBN: 0199580200 Category : Science Languages : en Pages : 345
Book Description
In the modern world of ever smaller devices and nanotechnology, electron crystallography emerges as the most important method capable of determining the structure of minute objects down to the size of individual atoms. Crystals of only a few millionths of a millimetre are studied. This is the first textbook explaining how this is done. Great attention is given to symmetry in crystals and how it manifests itself in electron microscopy and electron diffraction, and how this symmetry can be determined and taken advantage of in achieving improved electron microscopy images and solving crystal structures from electron diffraction patterns. Theory and practice are combined; experimental images, diffraction patterns, formulae and numerical data are discussed in parallel, giving the reader a complete understanding of what goes on inside the "black boxes" of computer programs. This up-to-date textbook contains the newest techniques in electron crystallography, including detailed descriptions and explanations of the recent remarkable successes in determining the very complex structures of zeolites and intermetallics. The controversial issue of whether there is phase information present in electron micrsocopy images or not is also resolved once and for all. The extensive appendices include computer labs which have been used at various courses at Stockholm University and international schools in electron crystallography, with applications to the textbook. Students can download image processing programs and follow these lab instructions to get a hands-on experience of electron crystallography.
Author: B. K. Vainshtein Publisher: Elsevier ISBN: 1483164756 Category : Science Languages : en Pages : 431
Book Description
Structure Analysis by Electron Diffraction focuses on the theory and practice of studying the atomic structure of crystalline substances through electron diffraction. The publication first offers information on diffraction methods in structure analysis and the geometrical theory of electron diffraction patterns. Discussions focus on the fundamental concepts of the theory of scattering and structure analysis of crystals, structure analysis by electron diffraction, formation of spot electron diffraction patterns, electron diffraction texture patterns, and polycrystalline electron diffraction patterns. The text then ponders on intensities of reflections, including atomic scattering, temperature factor, structure amplitude, experimental measurements of intensity, and review of equations for intensities of reflections in electron diffraction patterns. The manuscript examines the Fourier methods in electron diffraction and experimental electron diffraction structure investigations. Topics include the determination of the structure of the hydrated chlorides of transition metals; structures of carbides and nitrides of certain metals and semi-conducting alloys; electron diffraction investigation of clay minerals; and possibilities inherent in structure analysis by electron diffraction. The book is a helpful source of data for readers interested in structure analysis by electron diffraction.
Author: John Maxwell Cowley Publisher: Oxford University Press ISBN: 9780198557333 Category : Science Languages : en Pages : 442
Book Description
Volume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.
Author: V.G Tsirelson Publisher: CRC Press ISBN: 9780750302845 Category : Science Languages : en Pages : 544
Book Description
Electron Density and Bonding in Crystals: Principles, Theory and X-Ray Diffraction Experiments in Solid State Physics and Chemistry provides a comprehensive, unified account of the use of diffraction techniques to determine the distribution of electrons in crystals. The book discusses theoretical and practical techniques, the application of electron density studies to chemical bonding, and the determination of the physical properties of condensed matter. The book features the authors' own key contributions to the subject as well a thorough, critical summary of the extensive literature on electron density and bonding. Logically organized, coverage ranges from the theoretical and experimental basis of electron density determination to its impact on investigations of the nature of the chemical bond and its uses in determining electromagnetic and optical properties of crystals. The main text is supplemented by appendices that provide clear, concise guidance on aspects such as systems of units, quantum theory of atomic vibrations, atomic orbitals, and creation and annihilation operators. The result is a valuable compendium of modern knowledge on electron density distributions, making this reference a standard for crystallographers, condensed matter physicists, theoretical chemists, and materials scientists.
Author: Myeongkyu Lee Publisher: CRC Press ISBN: 1315361973 Category : Science Languages : en Pages : 302
Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Adam J. Schwartz Publisher: Springer Science & Business Media ISBN: 0387881360 Category : Technology & Engineering Languages : en Pages : 406
Book Description
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.
Author: Kaimin Shih Publisher: Nova Science Publishers ISBN: 9781628085914 Category : Materials Languages : en Pages : 0
Book Description
An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge boundaries. Written by more than 30 X-ray diffraction experts from 9 countries/regions, this book consists of 11 chapters examining the development of the XRD technique and demonstrating various new opportunities for its application. Each chapter discusses timely and important subjects surrounding the XRD technique, including the past and future of the single-crystal XRD technique and new explorations with co-ordination polymers; the very successful implementation of Rietveld refinement analysis for alloys, intermetallics, cements, and ceramics; the application of XRD in nanoparticles structure study; the methodological developments in quantifying the state of residual stress in materials; and the state-of-the-art progress in combining XRD principles with electron crystallography for structure determination.
Author: David John Dyson
Author: David John Dyson
Author: Brent Fultz
Author: Joseph Goldstein
Author: Xiaodong Zou
Author: B. K. Vainshtein
Author: John Maxwell Cowley
Author: V.G Tsirelson
Author: Myeongkyu Lee
Author: Adam J. Schwartz
Author: Kaimin Shih