Author: Hua SuPublisher:
ISBN:
Category :
Languages : en
Pages : 146
Book Description
Statistical Yield Optimization of Analog MOS Integrated Circuits
Author: Hua SuYield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Author: António Manuel Lourenço CanelasPublisher: Springer Nature
ISBN: 3030415368
Category : Technology & Engineering
Languages : en
Pages : 254
Book Description
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.
Yield and Variability Optimization of Integrated Circuits
Author: Jian Cheng ZhangPublisher: Springer Science & Business Media
ISBN: 1461522250
Category : Technology & Engineering
Languages : en
Pages : 244
Book Description
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.
Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
Author: Christopher MichaelPublisher: Springer Science & Business Media
ISBN: 1461531500
Category : Computers
Languages : en
Pages : 200
Book Description
As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.
Statistical Performance Modeling and Optimization
Author: Xin LiPublisher: Now Publishers Inc
ISBN: 1601980566
Category : Computers
Languages : en
Pages : 161
Book Description
Statistical Performance Modeling and Optimization reviews various statistical methodologies that have been recently developed to model, analyze and optimize performance variations at both transistor level and system level in integrated circuit (IC) design. The following topics are discussed in detail: sources of process variations, variation characterization and modeling, Monte Carlo analysis, response surface modeling, statistical timing and leakage analysis, probability distribution extraction, parametric yield estimation and robust IC optimization. These techniques provide the necessary CAD infrastructure that facilitates the bold move from deterministic, corner-based IC design toward statistical and probabilistic design. Statistical Performance Modeling and Optimization reviews and compares different statistical IC analysis and optimization techniques, and analyzes their trade-offs for practical industrial applications. It serves as a valuable reference for researchers, students and CAD practitioners.
Yield and Variability Optimization of Integrated Circuits
Author: Jian Cheng ZhangPublisher:
ISBN:
Category : Electronic circuit design
Languages : en
Pages : 360
Book Description
Low-power HF Microelectronics
Author: Gerson A. S. MachadoPublisher: IET
ISBN: 9780852968741
Category : Technology & Engineering
Languages : en
Pages : 1072
Book Description
This book brings together innovative modelling, simulation and design techniques in CMOS, SOI, GaAs and BJT to achieve successful high-yield manufacture for low-power, high-speed and reliable-by-design analogue and mixed-mode integrated systems.
Statistical Verification and Optimization of Integrated Circuits
Author: Yu BenPublisher:
ISBN:
Category :
Languages : en
Pages : 208
Book Description
Semiconductor technology has gone through several decades of aggressive scaling. The ever shrinking size of both transistors and interconnects is necessitating the interaction between the circuit designers and the foundries that fabricate the IC products. In particular, the designers must take into account the impact of the process variability early in the design stage. This includes both the verification and optimization of the circuit with statistical models characterizing the process variability. This thesis advances three frontiers in the variability-aware design flow. Yield estimation is a crucial but expensive verification step in circuit design. Existing methods either suffer from computationally intensive rare event probability calculation, or exhibit poor stability. We investigate the problem by combining partial least squares (PLS) regression, a dimension-reduction technique, with importance sampling, a variance-reduction technique. The simulation results show that the method is able to improve the convergence speed by at least an order of magnitude over existing fast simulation methods, and four orders of magnitude faster than Monte Carlo. In addition to PLS-preconditioned importance sampling, several other methods are also investigated, and their properties are compared. For a quicker verification of the robustness of the circuit, circuit designers often simulate the circuit using corner models. Current corner models are extracted using single transistor performances and cannot incorporate local variability. These facts limit the usage of corner models in deep sub-micron devices and analog applications. We propose to extract the customized corners using PLS regression. The method is tested using ISCAS'85 benchmark circuits. Both the probability density function and cumulative distribution function of the circuit performance predicted by the customized corners agree with Monte Carlo simulation, while delivering two orders of magnitude computational acceleration. The last frontier concerns robust circuit optimization. Most of the existing methods can only deal with a pessimistic worst-case problem. We choose to solve the ideal yield-constrained circuit optimization problem. To this end, we introduce the idea of robust convex approximation to design automation for the first time. Based on the convex approximation, we propose a sequential method to accommodate a realistic, hierarchical variability model. A simple line-search as an outer-loop algorithm is used to control the output the method. The optimization result shows that the proposed method is capable of handling circuits of thousands of gates without performance penalties due to overdesign.
Computer-Aided Design of Analog Integrated Circuits and Systems
Author: Rob A. RutenbarPublisher: John Wiley & Sons
ISBN: 047122782X
Category : Technology & Engineering
Languages : en
Pages : 773
Book Description
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Statistical Analysis and Optimization for VLSI: Timing and Power
Author: Ashish SrivastavaPublisher: Springer Science & Business Media
ISBN: 0387265287
Category : Technology & Engineering
Languages : en
Pages : 284
Book Description
Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues