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Author: José Pineda de Gyvez Publisher: John Wiley & Sons ISBN: 0780334477 Category : Technology & Engineering Languages : en Pages : 338
Book Description
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Author: José Pineda de Gyvez Publisher: John Wiley & Sons ISBN: 0780334477 Category : Technology & Engineering Languages : en Pages : 338
Book Description
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Author: Rob A. Rutenbar Publisher: John Wiley & Sons ISBN: 047122782X Category : Technology & Engineering Languages : en Pages : 773
Book Description
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Author: Eugenio Villar Bonet Publisher: Ed. Universidad de Cantabria ISBN: 9788481021585 Category : Technology & Engineering Languages : en Pages : 202
Book Description
Compendio de los trabajos presentados en Toledo durante el VHDL user's forum in Europe.
Author: Nuno Lourenço Publisher: Springer ISBN: 3319420372 Category : Technology & Engineering Languages : en Pages : 199
Book Description
This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the circuit, and on the methodologies to estimate the circuit’s performance. The discussion also includes robust circuit design and optimization and the most recent advances in layout-aware analog sizing approaches. The authors describe a methodology for an automatic flow for analog IC design, including details of the inputs and interfaces, multi-objective optimization techniques, and the enhancements made in the base implementation by using machine leaning techniques. The Gradient model is discussed in detail, along with the methods to include layout effects in the circuit sizing. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. An extensive set of application examples is included to demonstrate the capabilities and features of the methodologies described.
Author: Cesare Alippi Publisher: Springer ISBN: 3642042740 Category : Computers Languages : en Pages : 1062
Book Description
This volume is part of the two-volume proceedings of the 19th International Conf- ence on Artificial Neural Networks (ICANN 2009), which was held in Cyprus during September 14–17, 2009. The ICANN conference is an annual meeting sp- sored by the European Neural Network Society (ENNS), in cooperation with the - ternational Neural Network Society (INNS) and the Japanese Neural Network Society (JNNS). ICANN 2009 was technically sponsored by the IEEE Computational Intel- gence Society. This series of conferences has been held annually since 1991 in various European countries and covers the field of neurocomputing, learning systems and related areas. Artificial neural networks provide an information-processing structure inspired by biological nervous systems. They consist of a large number of highly interconnected processing elements, with the capability of learning by example. The field of artificial neural networks has evolved significantly in the last two decades, with active partici- tion from diverse fields, such as engineering, computer science, mathematics, artificial intelligence, system theory, biology, operations research, and neuroscience. Artificial neural networks have been widely applied for pattern recognition, control, optimization, image processing, classification, signal processing, etc.
Author: José Pineda de Gyvez
Author: José Pineda de Gyvez
Author: 
Author: 
Author: Rob A. Rutenbar
Author: Eugenio Villar Bonet
Author: 
Author: Nuno Lourenço
Author: 
Author: Cesare Alippi
Author: University of Michigan--Dearborn