Special Boundary Study PDF Download

Author:
Publisher:
ISBN:
Category : Harpers Ferry (W. Va.)
Languages : en
Pages : 48

View

Book Description

Author:
Publisher:
ISBN:
Category : Boundaries
Languages : en
Pages : 302

View

Book Description

Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1228

View

Book Description
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index

Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1228

View

Book Description

Author: Gunter Gottstein
Publisher: CRC Press
ISBN: 1439858993
Category : Science
Languages : en
Pages : 601

View

Book Description
A major goal of materials science is to create new engineering materials and optimize their cost and performance. Understanding how adjacent materials behave at their borders is an essential part of this process. Grain boundaries are the longest-known crystal defects, but although they were discovered in the mid-eighteenth century, until quite rece

Author: Valerie Randle
Publisher: CRC Press
ISBN: 1482287471
Category : Technology & Engineering
Languages : en
Pages : 410

View

Book Description
Encompassing the concepts, practice, and application of orientation analysis, Introduction to Texture Analysis is an essential reference source for reserachers in textiles. The author uses an accessible style to share her expertise, providing comprehensive coverage of the theory and practice of the texture techniques now available and discusses the

Author: Sreeramamurthy Ankem
Publisher: John Wiley & Sons
ISBN: 1118788508
Category : Technology & Engineering
Languages : en
Pages : 397

View

Book Description
The International Symposium was organized to capture the state of our knowledge on the science and technology of interfaces. The Symposium (in honor of Dr. B. B. Rath) was held during the TMS Annual meeting, Feb 17-21, 2002 at Seattle WA. This volume captures the salient papers presented at the symposium. The symposium was sponsored by the Structural Materials Division and the Electronic, Magnetic & Photonic Materials Division of TMS and the Materials Science Critical Technology Sector of ASM International and in particular by the following committees: the Physical Metallurgy Committee (TMS), the Superconducting Materials Committee (TMS), the Titanium Committee (TMD) and the Mechanical Behavior of Materials Committee (TMS/ASM). The objective of this symposium was to present current research on advanced interface controlled materials with primary focus on advanced materials. Special attention was given to design of such interface controlled materials with their unique and highly desirable properties. The symposium was designed to assess the current status and to identify future directions of research, design and applications of the role of interfaces in nanostructured bulk solids, films and coatings as well as polycrystalline superconducting materials. Particular emphasis was placed on developing close interactions and fostering future collaborations among scientists and engineers from the USA, Western and Eastern Europe, Russia, and other Asian countries.

Author: Geological Survey (U.S.)
Publisher:
ISBN:
Category : Forest reserves
Languages : en
Pages : 784

View

Book Description

Author: Olaf Engler
Publisher: CRC Press
ISBN: 1000997944
Category : Science
Languages : en
Pages : 697

View

Book Description
Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. Thoroughly updated, this Third Edition of a best-seller is a rare introductory-level guide to texture analysis. Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including electron backscatter diffraction (EBSD). Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Offers new and innovative grain boundary descriptions and examples. This book is an ideal tool to help readers in the materials sciences develop a working understanding of the practice and applications of texture.

Author: National Research Council (U.S.). Advisory Committee on Perspectives in Materials Research
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 788

View

Book Description