Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life PDF Download

Author: Yuri V. Chugui
Publisher:
ISBN:
Category : Laser interferometers
Languages : en
Pages : 710

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Author: Wolfgang Osten
Publisher: Springer Science & Business Media
ISBN: 3642030513
Category : Technology & Engineering
Languages : en
Pages : 808

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21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.

Author: Michail Michailov
Publisher: Springer Science & Business Media
ISBN: 3642165109
Category : Technology & Engineering
Languages : en
Pages : 294

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This book presents the state of the art in nanoscale surface physics. It outlines contemporary trends in the field covering a wide range of topical areas: atomic structure of surfaces and interfaces, molecular films and polymer adsorption, biologically inspired nanophysics, surface design and pattern formation, and computer modeling of interfacial phenomena. Bridging "classical" and "nano" concepts, the present volume brings attention to the physical background of exotic condensed-matter properties. The book is devoted to Iwan Stranski and Rostislaw Kaischew, remarkable scientists, who played a crucial role in setting up the theoretical fundamentals of nucleation and crystal growth phenomena in the last century.

Author: R. Rodriguez-Vera
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Mathematics
Languages : en
Pages : 886

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Author: Pavel Polach
Publisher: Trans Tech Publications Ltd
ISBN: 3038267996
Category : Technology & Engineering
Languages : en
Pages : 433

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Special topic volume with selected papers from the 52nd International Scientific Conference on Experimental Stress Analysis (EAN 2014), June 2-6, 2014, Mariánské Lázně, Czech Republic

Author: William T. Arkin
Publisher: Nova Publishers
ISBN: 9781594544989
Category : Technology & Engineering
Languages : en
Pages : 294

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This new book gathers leading research from throughout the world.

Author: Guillermo H. Kaufmann
Publisher: John Wiley & Sons
ISBN: 3527633871
Category : Science
Languages : en
Pages : 322

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Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.

Author: Cruz-Cunha, Maria Manuela
Publisher: IGI Global
ISBN: 1605668931
Category : Business & Economics
Languages : en
Pages : 605

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Discusses the main issues, challenges, opportunities, and trends related to the impact of IT on every part of organizational and inter-organizational environments.

Author: British Library. Document Supply Centre
Publisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 870

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Author:
Publisher:
ISBN:
Category : Congresses and conventions
Languages : en
Pages : 636

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