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Author: Peter W. Epperlein Publisher: John Wiley & Sons ISBN: 1118481860 Category : Technology & Engineering Languages : en Pages : 522
Book Description
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author: Peter W. Epperlein Publisher: John Wiley & Sons ISBN: 1118481860 Category : Technology & Engineering Languages : en Pages : 522
Book Description
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author: Massimo Vanzi Publisher: Elsevier ISBN: 0081010893 Category : Technology & Engineering Languages : en Pages : 270
Book Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Author: Publisher: ISBN: Category : Languages : en Pages : 4
Book Description
The reliability of semiconductor laser diodes and related devices is a significant issue for their deployment in many applications, creating demand for device diagnostics applicable to packaged devices. Measurements of the transparency current density (J0) in laser diodes and traveling-wave semiconductor optical amplifiers (SOAs) can provide such a diagnostic. It is essential, however, to measure J0 on packaged devices, so that they can be characterized after aging or degradation. This precludes techniques requiring data from multiple devices (e.g., an ensemble with different lengths). J0 is conventionally measured using a junction-voltage technique, in which an input optical signal induces a change in carrier density in the active region due to stimulated absorption or emission. The result is a voltage drop across the diode. At material transparency, the stimulated absorption is exactly balanced by the stimulated emission and the voltage drop goes to zero. Since the polarity of the voltage drop changes sign at current densities above J0, the optical input beam is typically modulated and lock-in amplification is employed to sensitively detect the polarity sign flip. Here we show that this technique is not reliable for certain types of laser structures, because the deduced J0 is strongly dependent on device packaging -- that is, the measured J0 varies with the manner in which light is coupled into the diode waveguide. For packaged SOAs, we propose and demonstrate an alternative all-optical technique to overcome this problem. One important advantage of the optical method over the junction voltage method is that the actual device optically-guided mode is directly sampled. In the case of packaged semiconductor lasers, our all-optical method can complement the junction-voltage method to resolve device versus packaging degradation.
Author: Madeleine Glick Publisher: Elsevier ISBN: 032391831X Category : Technology & Engineering Languages : en Pages : 523
Book Description
Integrated Photonics for Data Communications Applications reviews the key concepts, design principles, performance metrics and manufacturing processes from advanced photonic devices to integrated photonic circuits. The book presents an overview of the trends and commercial needs of data communication in data centers and high-performance computing, with contributions from end users presenting key performance indicators. In addition, the fundamental building blocks are reviewed, along with the devices (lasers, modulators, photodetectors and passive devices) that are the individual elements that make up the photonic circuits. These chapters include an overview of device structure and design principles and their impact on performance. Following sections focus on putting these devices together to design and fabricate application-specific photonic integrated circuits to meet performance requirements, along with key areas and challenges critical to the commercial manufacturing of photonic integrated circuits and the supply chains being developed to support innovation and market integration are discussed. This series is led by Dr. Lionel Kimerling Executive at AIM Photonics Academy and Thomas Lord Professor of Materials Science and Engineering at MIT and Dr. Sajan Saini Education Director at AIM Photonics Academy at MIT. Each edited volume features thought-leaders from academia and industry in the four application area fronts (data communications, high-speed wireless, smart sensing, and imaging) and addresses the latest advances. - Includes contributions from leading experts and end-users across academia and industry working on the most exciting research directions of integrated photonics for data communications applications - Provides an overview of data communication-specific integrated photonics starting from fundamental building block devices to photonic integrated circuits to manufacturing tools and processes - Presents key performance metrics, design principles, performance impact of manufacturing variations and operating conditions, as well as pivotal performance benchmarks
Author: Kamal Nain Chopra Publisher: Springer Nature ISBN: 9811583803 Category : Technology & Engineering Languages : en Pages : 138
Book Description
The book presents the detailed study of optoelectronic gyroscopes, especially Ring Laser Gyroscopes (RLGs) and Fiber Optic Gyroscopes (FOGs). It discusses their design in detail to optimize their performance, besides explaining the related concepts and the new developments. Other topics covered in this book are double ion beam sputtering for fabricating RLG mirrors on the high quality optical substrates, optical testing, and thin films characterization techniques. The book will be useful for the researchers, professionals, and engineers working in the areas of optical gyroscopes and the related technologies.
Author: Mitsuo Fukuda Publisher: Artech House on Demand ISBN: 9780890064658 Category : Technology & Engineering Languages : en Pages : 343
Book Description
This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.
Author: Hooshang Ghafouri-shiraz Publisher: World Scientific ISBN: 1783261099 Category : Technology & Engineering Languages : en Pages : 699
Book Description
Optical communications technology is growing increasingly in importance, with a rapid pace of development. Innovative optical devices have emerged from the integration of semiconductor laser diodes, amplifiers and filters with optical waveguide technology. This well-researched volume traces the evolution of semiconductor laser amplifiers (SLAs) from these technologies. Focusing on the principle applications of SLAs, the author illustrates the growing importance of these functional components in the future of optical communications systems.This book will provide engineering and science students with a basic understanding of laser diode and optical amplification through the analysis of the performance characteristics of these devices both in theory and application. Practising device engineers wishing to consolidate their knowledge in lightwave technology will also find this book an invaluable reference./a
Author: Peter W. Epperlein
Author: Peter W. Epperlein
Author: Massimo Vanzi
Author: 
Author: Madeleine Glick
Author: Kamal Nain Chopra
Author: Mitsuo Fukuda
Author: Hooshang Ghafouri-shiraz
Author: P. G. Eliseev
Author: Ajay R. Patel
Author: Society of Photographic Instrumentation Engineers