Author: Stanley Ray Groenig
Publisher:
ISBN:
Category : Switching theory
Languages : en
Pages : 41
Book Description
Self Fault Detection in Asynchronous Sequential Circuits
Author: Stanley Ray Groenig
Publisher:
ISBN:
Category : Switching theory
Languages : en
Pages : 41
Book Description
Publisher:
ISBN:
Category : Switching theory
Languages : en
Pages : 41
Book Description
Fault Detection in Asynchronous Sequential Circuits
Author: Jeng-Chuan Kau
Publisher:
ISBN:
Category : Asynchronous circuits
Languages : en
Pages : 86
Book Description
"As the asynchronous sequential circuit has become more and more important to digital systems in recent years high reliability and simple maintenance of the circuit is stressed. This paper presents a fault-detection algorithm which will be applicable to most of the practical asynchronous sequential circuits. The asynchronous sequential circuit is treated from the combinatoric point of view. First the minimal set of states, both stable states and unstable states, sufficient to detect all possible faults of the circuit is found from the fault table. Then a test sequence is generated to go through these states. It is assumed that testing outputs can be added. Simple and systematic techniques are also presented for the construction of fault table and the generation of test sequence. The usefulness of this algorithm increases as the density of the stable states associated with the circuit increases"--Abstract, leaf ii.
Publisher:
ISBN:
Category : Asynchronous circuits
Languages : en
Pages : 86
Book Description
"As the asynchronous sequential circuit has become more and more important to digital systems in recent years high reliability and simple maintenance of the circuit is stressed. This paper presents a fault-detection algorithm which will be applicable to most of the practical asynchronous sequential circuits. The asynchronous sequential circuit is treated from the combinatoric point of view. First the minimal set of states, both stable states and unstable states, sufficient to detect all possible faults of the circuit is found from the fault table. Then a test sequence is generated to go through these states. It is assumed that testing outputs can be added. Simple and systematic techniques are also presented for the construction of fault table and the generation of test sequence. The usefulness of this algorithm increases as the density of the stable states associated with the circuit increases"--Abstract, leaf ii.
Fault Detection in Asynchronous Sequential Circuit
Author: Kenneth Chin
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 85
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 85
Book Description
Design of Fault Detecting Asynchronous Sequential Circuits
Author: Dwight Holden Sawin
Publisher:
ISBN:
Category : Sequential machine theory
Languages : en
Pages : 48
Book Description
Publisher:
ISBN:
Category : Sequential machine theory
Languages : en
Pages : 48
Book Description
On Fault Diagnosis
Author: Louis Gwo-Jiun Chu
Publisher:
ISBN:
Category : Electric network analysis
Languages : en
Pages : 334
Book Description
Publisher:
ISBN:
Category : Electric network analysis
Languages : en
Pages : 334
Book Description
Fault Detection in Sequential Circuits
Author: Edward George Sable
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 584
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 584
Book Description
A Test Mode Approach to Fault Detection in Sequential Circuits
Author: J. Rettig
Publisher:
ISBN:
Category : Sequential analysis
Languages : en
Pages : 88
Book Description
Publisher:
ISBN:
Category : Sequential analysis
Languages : en
Pages : 88
Book Description
Fault Diagnosis of Digital Circuits
Author: V. N. Yarmolik
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216
Book Description
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216
Book Description
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.
An Algorithm for Automatic Fault Detection in Sequential Circuits
Author: Donald Whitesell Hartman
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
Book Description
Fault Detection in Sequential Logic Circuits
Author: Thomas Charles Hartrum
Publisher:
ISBN:
Category : Sequential machine theory
Languages : en
Pages : 114
Book Description
Publisher:
ISBN:
Category : Sequential machine theory
Languages : en
Pages : 114
Book Description