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Author: S. M. Lang Publisher: ISBN: Category : Goniometers Languages : en Pages : 105
Book Description
A successful study resulted in the assembly of an inductively-heated high-temperature x-ray diffractometer furnace that operates with an unmodified Norelco high-angle goniometer spectrometer. The design criteria, the various feasibility trials, and the general features of the instrument are discussed.
Author: S. M. Lang Publisher: ISBN: Category : Goniometers Languages : en Pages : 105
Book Description
A successful study resulted in the assembly of an inductively-heated high-temperature x-ray diffractometer furnace that operates with an unmodified Norelco high-angle goniometer spectrometer. The design criteria, the various feasibility trials, and the general features of the instrument are discussed.
Author: Deborah D. L. Chung Publisher: Wiley-VCH ISBN: Category : X-rays Languages : en Pages : 288
Book Description
A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR
Author: S. M. Lang Publisher: ISBN: Category : Materials at high temperatures Languages : en Pages : 94
Book Description
High accuracy (0.005 degree 2-theta) and high precision (0.002 degree 2-theta) for x-ray diffraction measurements at angles from less than zero to 155-160 degrees 2-theta at sample temperatures to 2600-2800C in oxidizing, neutral, reducing, or evacuated atmospheric environments are characteristics of a high-temperature x-ray diffractometer system specifically designed for research studies. Within the noble-metal thermocouple temperature range, very rapid thermal equilibrium -- 500C intervals in less than 3 seconds -- can be attained. The crystallometry of zirconium dioxide, ZrO2, has been surveyed in the range from room temperature to 1750C in normal air atmosphere at ambient pressure. Topics studied in some detail have been (a) the hysteresis of the monoclinic-tetragonal zirconia transformation, (b) the axial thermal expansion of tetragonal zirconia to 1750C, (c) the determination of axial expansion data for platinum and beryllium oxide for use as sample temperature indicators, and (d) new mathematical solutions of the classical d-value equations for lattice constants calculations. It has been shown that significant physical properties and constants can be measured for ZrO2 if the oxygen stoichiometry is established and maintained at an (unknown) equilibrium, or pseudo-equilibrium, value. (Author).
Author: Reuben Rudman Publisher: Springer ISBN: Category : Science Languages : en Pages : 370
Book Description
Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature. LTXRD studies can be frustrating: There are at least two reports of investigations ruined by the loss of crystals (grown with extreme difficulty) because of the widespread power failure and blackout in the northeastern United States in late 1965. LTXRD studies can cause discomfort: In several instances, "low temperatures" have been attained by opening all the windows in the X-ray laboratory. LTXRD studies can be dangerous: It was once reported that a crys tal was lost because a laboratory assistant fell down a flight of stairs and lay unconscious for about an hour on his way to refilling a liquid-nitrogen (LN2 ) dewar. This last report indicated the disposition of the crystal but not that of the laboratory assistant. However, in general, the results of low-temperature X-ray diffraction investigations cannot be obtained in any other manner, and one is well compensated for the effort expended in constructing and maintaining a low-temperature system. Crystal-structure analyses of solidified liquids and gases, phase transformation investigations, accurate crystal-structure analy ses and electron-density maps, thermal expansion measurements, and defect structure studies are a few of the many important applications of LTXRD.
Author: S. K. CHATTERJEE Publisher: PHI Learning Pvt. Ltd. ISBN: 8120341945 Category : Science Languages : en Pages : 221
Book Description
Designed for the undergraduate and postgraduate students of physics, materials science and metallurgical engineering, this text explains the theory of X-ray diffraction starting from diffraction by an electron to that by an atom, a crystal, and finally ending with a diffraction by a conglomerate of atoms either in the single crystal or in the polycrystal stage. This Second Edition of the book includes a new chapter on Electron Diffraction as electron diffraction along with X-ray diffraction are complementary to each other and are also included in the curriculum. The book amply blends the theory with major applications of X-ray diffraction, including those of direct analysis of lattice defects by X-ray topography, orientation texture analysis, chemical analysis by diffraction as well as by fluorescence. KEY FEATURES : Set of numerical problems along with solutions Details of some different experimental techniques Unsolved problems and Review Questions to grasp the concepts.
Author: Reuben Rudman Publisher: Springer ISBN: 9781461587712 Category : Science Languages : en Pages : 0
Book Description
Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature. LTXRD studies can be frustrating: There are at least two reports of investigations ruined by the loss of crystals (grown with extreme difficulty) because of the widespread power failure and blackout in the northeastern United States in late 1965. LTXRD studies can cause discomfort: In several instances, "low temperatures" have been attained by opening all the windows in the X-ray laboratory. LTXRD studies can be dangerous: It was once reported that a crys tal was lost because a laboratory assistant fell down a flight of stairs and lay unconscious for about an hour on his way to refilling a liquid-nitrogen (LN2 ) dewar. This last report indicated the disposition of the crystal but not that of the laboratory assistant. However, in general, the results of low-temperature X-ray diffraction investigations cannot be obtained in any other manner, and one is well compensated for the effort expended in constructing and maintaining a low-temperature system. Crystal-structure analyses of solidified liquids and gases, phase transformation investigations, accurate crystal-structure analy ses and electron-density maps, thermal expansion measurements, and defect structure studies are a few of the many important applications of LTXRD.
Author: S. M. Lang
Author: S. M. Lang
Author: Ashok Kumar Singh
Author: Deborah D. L. Chung
Author: S. M. Lang
Author: Ralph Early Grim
Author: Reuben Rudman
Author: S. K. CHATTERJEE
Author: H. J. Goldschmidt
Author: Reuben Rudman
Author: William Joseph Campbell