Reliability and Robust Design in Automotive Engineering PDF Download

Author:
Publisher:
ISBN:
Category : Automobiles
Languages : en
Pages : 550

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Author: Bo Bergman
Publisher: John Wiley & Sons
ISBN: 047074880X
Category : Technology & Engineering
Languages : en
Pages : 214

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Book Description
Based on deep theoretical as well as practical experience in Reliability and Quality Sciences, Robust Design Methodology for Reliability constructively addresses practical reliability problems. It offers a comprehensive design theory for reliability, utilizing robust design methodology and six sigma frameworks. In particular, the relation between un-reliability and variation and uncertainty is explored and reliability improvement measures in early product development stages are suggested. Many companies today utilise design for Six Sigma (DfSS) for strategic improvement of the design process, but often without explicitly describing the reliability perspective; this book explains how reliability design can relate to and work with DfSS and illustrates this with real–world problems. The contributors advocate designing for robustness, i.e. insensitivity to variation in the early stages of product design development. Methods for rational treatment of uncertainties in model assumptions are also presented. This book promotes a new approach to reliability thinking that addresses the design process and proneness to failure in the design phase via sensitivity to variation and uncertainty; includes contributions from both academics and industry practitioners with a broad scope of expertise, including quality science, mathematical statistics and reliability engineering; takes the innovative approach of promoting the study of variation and uncertainty as a basis for reliability work; includes case studies and illustrative examples that translate the theory into practice. Robust Design Methodology for Reliability provides a starting point for new thinking in practical reliability improvement work that will appeal to advanced designers and reliability specialists in academia and industry including fatigue engineers, product development and process/ quality professionals, especially those interested in and/ or using the DfSS framework.

Author:
Publisher:
ISBN:
Category : Automobile
Languages : en
Pages : 562

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Book Description
Collection of papers from the "Reliability & Robust Design in Automotive Engineering" session of the SAE 2006 World Congress, held April 3-6 in Detroit, Michigan.

Author: Ronald K Jurgen
Publisher: SAE International
ISBN: 0768034922
Category : Technology & Engineering
Languages : en
Pages : 377

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Book Description
Vehicle reliability problems continue to be the news because of major vehicle recalls from several manufacturers. This book includes 40 SAE technical papers, published from 2007 through 2010, that describe the latest research on automotive electronics reliability technology. This book will help engineers and researchers focus on the design strategies being used to minimize electronics reliability problems, and how to test and verify those strategies. After an overview of durability, risk assessment, and failure mechanisms, this book focuses on state-of-the-art techniques for reliability-based design, and reliability testing and verification. Topics include: powertrain control monitoring distributed automotive embedded systems model-based design x-by-wire systems battery durability design verification fault tree analysis The book also includes editor Ronald K. Jurgen’s introduction ,“Striving for Maximum Reliability in a Highly Complex Electronic Environment”, and a concluding section on the future of electronics reliability, including networking technology, domain control units, the use of AUTOSAR, and embedded software.

Author:
Publisher:
ISBN: 9780768011579
Category : Technology & Engineering
Languages : en
Pages : 330

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Book Description
Collection of papers from the "Reliability & Robust Design in Automotive Engineering" session of the SAE 2003 World Congress, held March 3-6 in Detroit, Michigan.

Author: Kirk A. Gray
Publisher: John Wiley & Sons
ISBN: 111870021X
Category : Technology & Engineering
Languages : en
Pages : 296

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Book Description
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.

Author: Efstratios Nikolaidis
Publisher: CRC Press
ISBN: 0203483936
Category : Mathematics
Languages : en
Pages : 1216

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Book Description
Researchers in the engineering industry and academia are making important advances on reliability-based design and modeling of uncertainty when data is limited. Non deterministic approaches have enabled industries to save billions by reducing design and warranty costs and by improving quality. Considering the lack of comprehensive and defini

Author: Seong-woo Woo
Publisher: CRC Press
ISBN: 0429664036
Category : Technology & Engineering
Languages : en
Pages : 358

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Book Description
This book introduces and explains the parametric accelerated life testing (ALT) methodology as a new reliability methodology based on statistics, to help avoid recalls of products in the marketplace. The book includes problems and case studies to help with reader comprehension. It provides an introduction to reliability design of the mechanical system as an alternative to Taguchi’s experimental methodology and enables engineers to correct faulty designs and determine if the targeted product reliability is achieved. Additionally, it presents a robust design methodology of mechanical products to withstand a variety of loads. This book is intended for engineers of many fields, including industrial engineers, mechanical engineers, and systems engineers.

Author: Guang Yang
Publisher: John Wiley & Sons
ISBN: 0471715298
Category : Technology & Engineering
Languages : en
Pages : 533

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Book Description
As the Lead Reliability Engineer for Ford Motor Company, Guangbin Yang is involved with all aspects of the design and production of complex automotive systems. Focusing on real-world problems and solutions, Life Cycle Reliability Engineering covers the gamut of the techniques used for reliability assurance throughout a product's life cycle. Yang pulls real-world examples from his work and other industries to explain the methods of robust design (designing reliability into a product or system ahead of time), statistical and real product testing, software testing, and ultimately verification and warranting of the final product's reliability

Author: Young J. Chiang
Publisher: SAE International
ISBN: 1468606026
Category : Computers
Languages : en
Pages : 358

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Book Description
In a world where innovation and sustainability are paramount, Fundamentals of Design of Experiments for Automotive Engineering: Volume I serves as a definitive guide to harnessing the power of statistical thinking in product development. As first of four volumes in SAE International’s DOE for Product Reliability Growth series, this book presents a practical, application-focused approach by emphasizing DOE as a dynamic tool for automotive engineers. It showcases real-world examples, demonstrating how process improvements and system optimizations can significantly enhance product reliability. The author, Yung Chiang, leverages extensive product development expertise to present a comprehensive process that ensures product performance and reliability throughout its entire lifecycle. Whether individuals are involved in research, design, testing, manufacturing, or marketing, this essential reference equips them with the skills needed to excel in their respective roles. This book explores the potential of Reliability and Sustainability with DOE, featuring the following topics: - Fundamental prerequisites for deploying DOE: Product reliability processes, measurement uncertainty, failure analysis, and design for reliability. - Full factorial design 2K: A system identification tool for relating objectives to factors and understanding main and interactive effects. - Fractional factorial design 2RK-P: Ideal for identifying main effects and 2-factor interactions. - General fractional factorial design LK-P: Systematically identification of significant inputs and analysis of nonlinear behaviors. - Composite designs as response surface methods: Resolving interactions and optimizing decisions with limited factors. - Adapting to practical challenges with “short” DOE: Leveraging optimization schemes like D-optimality, and A-optimality for optimal results. Readers are encouraged not to allow product failures to hinder progress but to embrace the "statistical thinking" embedded in DOE. This book can illuminate the path to designing products that stand the test of time, resulting in satisfied customers and thriving businesses. (ISBN 9781468606027, ISBN 9781468606034, ISBN 9781468606041, DOI 10.4271/9781468606034)