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Author: Waltraud Kahle Publisher: John Wiley & Sons ISBN: 111930752X Category : Mathematics Languages : en Pages : 242
Book Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Author: Waltraud Kahle Publisher: John Wiley & Sons ISBN: 111930752X Category : Mathematics Languages : en Pages : 242
Book Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Author: Osamu Ueda Publisher: Artech House Publishers ISBN: Category : Science Languages : en Pages : 376
Book Description
In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.
Author: Dimitris Kiritsis Publisher: Springer Science & Business Media ISBN: 0857293206 Category : Technology & Engineering Languages : en Pages : 997
Book Description
Engineering Asset Management discusses state-of-the-art trends and developments in the emerging field of engineering asset management as presented at the Fourth World Congress on Engineering Asset Management (WCEAM). It is an excellent reference for practitioners, researchers and students in the multidisciplinary field of asset management, covering such topics as asset condition monitoring and intelligent maintenance; asset data warehousing, data mining and fusion; asset performance and level-of-service models; design and life-cycle integrity of physical assets; deterioration and preservation models for assets; education and training in asset management; engineering standards in asset management; fault diagnosis and prognostics; financial analysis methods for physical assets; human dimensions in integrated asset management; information quality management; information systems and knowledge management; intelligent sensors and devices; maintenance strategies in asset management; optimisation decisions in asset management; risk management in asset management; strategic asset management; and sustainability in asset management.
Author: Hsinjin Edwin Yang Publisher: William Andrew ISBN: 0128115459 Category : Technology & Engineering Languages : en Pages : 356
Book Description
Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules describes the durability and reliability behavior of polymers used in Si-photovoltaic modules and systems, particularly in terms of physical aging and degradation process/mechanisms, characterization methods, accelerated exposure chamber and testing, module level testing, and service life prediction. The book compares polymeric materials to traditional materials used in solar applications, explaining the degradation pathways of the different elements of a photovoltaic module, including encapsulant, front sheet, back sheet, wires and connectors, adhesives, sealants, and more. In addition, users will find sections on the tests needed for the evaluation of polymer degradation and aging, as well as accelerated tests to aid in materials selection. As demand for photovoltaics continues to grow globally, with polymer photovoltaics offering significantly lower production costs compared to earlier approaches, this book will serve as a welcome resource on new avenues.
Author: Milton Ohring Publisher: Academic Press ISBN: 0080575528 Category : Technology & Engineering Languages : en Pages : 759
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: Ding-Geng (Din) Chen Publisher: Springer ISBN: 9811051941 Category : Mathematics Languages : en Pages : 382
Book Description
This book focuses on the statistical aspects of the analysis of degradation data. In recent years, degradation data analysis has come to play an increasingly important role in different disciplines such as reliability, public health sciences, and finance. For example, information on products’ reliability can be obtained by analyzing degradation data. In addition, statistical modeling and inference techniques have been developed on the basis of different degradation measures. The book brings together experts engaged in statistical modeling and inference, presenting and discussing important recent advances in degradation data analysis and related applications. The topics covered are timely and have considerable potential to impact both statistics and reliability engineering.
Author: M.S. Nikulin Publisher: Birkhäuser ISBN: 9780817649234 Category : Mathematics Languages : en Pages : 416
Book Description
This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.
Author: Mitsuo Fukuda Publisher: Artech House on Demand ISBN: 9780890064658 Category : Technology & Engineering Languages : en Pages : 343
Book Description
This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.
Author: J. W. McPherson Publisher: Springer Science & Business Media ISBN: 3319001221 Category : Technology & Engineering Languages : en Pages : 406
Book Description
"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Author: Waltraud Kahle
Author: Waltraud Kahle
Author: Osamu Ueda
Author: Dimitris Kiritsis
Author: Hsinjin Edwin Yang
Author: Milton Ohring
Author: Ding-Geng (Din) Chen
Author: M. J. Howes
Author: M.S. Nikulin
Author: Mitsuo Fukuda
Author: J. W. McPherson