Reflection From, and Transmission Through, Rough Surfaces ... PDF Download

Author: Arthur Feddeman Gorton
Publisher:
ISBN:
Category : Reflection (Optics)
Languages : en
Pages : 0

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Author: Arthur Feddeman Gorton
Publisher:
ISBN:
Category : Reflection (Optics)
Languages : en
Pages : 24

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Author: Matt Pharr
Publisher: Morgan Kaufmann
ISBN: 0123750792
Category : Computers
Languages : en
Pages : 1201

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Book Description
This updated edition describes both the mathematical theory behind a modern photorealistic rendering system as well as its practical implementation. Through the ideas and software in this book, designers will learn to design and employ a full-featured rendering system for creating stunning imagery. Includes a companion site complete with source code for the rendering system described in the book, with support for Windows, OS X, and Linux.

Author: Arthur Feddeman Gorton
Publisher:
ISBN:
Category :
Languages : en
Pages : 14

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Author: Nicolas Pinel
Publisher: John Wiley & Sons
ISBN: 1118579461
Category : Science
Languages : en
Pages : 122

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Book Description
Electromagnetic wave scattering from random rough surfaces is an active, interdisciplinary area of research with myriad practical applications in fields such as optics, acoustics, geoscience and remote sensing. Focusing on the case of random rough surfaces, this book presents classical asymptotic models used to describe electromagnetic wave scattering. The authors begin by outlining the basic concepts relevant to the topic before moving on to look at the derivation of the scattered field under asymptotic models, based on the Kirchhoff-tangent plane, in order to calculate both the scattered field and the statistical average intensity. More elaborated asymptotic models are also described for dealing with specific cases, and numerical results are presented to illustrate these models. Comparisons with a reference numerical method are made to confirm and refine the theoretical validity domains. The final chapter derives the expressions of the scattering intensities of random rough surfaces under the asymptotic models. Its expressions are given for their incoherent contributions, from statistical calculations. These results are then compared with numerical computations using a Monte-Carlo process, as well as with experimental models, for sea surface backscattering. Contents 1. Electromagnetic Wave Scattering from Random Rough Surfaces: Basics. 2. Derivation of the Scattered Field under Asymptotic Models. 3. Derivation of the Normalized Radar Cross-Section under Asymptotic Models. APPENDIX 1. Far-Field Scattered Fields under the Method of Stationary Phase. APPENDIX 2. Calculation of the Scattering Coefficients under the GO for 3D Problems. About the Authors Nicolas Pinel worked as a Research Engineer at the IETR (Institut d’Electronique et de Télécommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) before joining Alyotech Technologies in Rennes, France, in July 2013. His research interests are in the areas of radar and optical remote sensing, scattering and propagation. In particular, he works on asymptotic methods of electromagnetic wave scattering from random rough surfaces and layers. Christophe Bourlier works at the IETR (Institut d’Electronique et de Télécommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) and is also a Researcher at the French National Center for Scientific Research (CNRS) on electromagnetic wave scattering from rough surfaces and objects for remote sensing applications and radar signatures. He is the author of more than 160 journal articles and conference papers.

Author: Jean-Pierre Pugliese
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Author: Jean Daillant
Publisher: Springer Science & Business Media
ISBN: 3540486968
Category : Science
Languages : en
Pages : 347

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Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 794

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Vols. for 1903- include Proceedings of the American Physical Society.

Author: Dick Bedeaux
Publisher: World Scientific
ISBN: 1860944507
Category : Science
Languages : en
Pages : 465

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Book Description
This invaluable book represents a substantial body of work describing the theory of the optical properties of thin island films and rough surfaces. In both cases the feature sizes are small compared to the wavelength of light. The approach is extremely rigorous and theoretically very thorough. The reflection, transmission and absorption of light are described. Computer programs that provide exact solutions for theoretical properties of thin island films are available, and this makes the book of great practical use. The early chapters present a comprehensive theoretical framework. In this new edition a chapter on reflection from gyrotropic media has been added. Contributions due to the gyrotropic nature of the interfacial layer are discussed.

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 190

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Book Description
This project is concerned with theoretical and experimental studies of the scattering of light from and its transmission through randomly rough surfaces. The most significant results obtained during the reporting period include the design of one-dimensional random surfaces that transmit light in a specified fashion; the demonstration that the scattering of light from the random surface of an amplifying (gain) medium increases the height of and narrows the enhanced backscattering peak; the prediction of multiple-scattering effects in the second harmonic generation of light in reflection from a clean random metal surface and in transmission through a rough metal film in the Kretchmann attenuated total reflection geometry; the theoretical study of the wavelength dependence of the reflectivity and total scattered energy when p-polarized light is scattered from a rough dielectric film deposited on a metallic substrate; the development of a new perturbation theory of rough surface scattering in which the small parameter is the dielectric contrast between the medium of incidence and the scattering medium; and the observation of spectral changes (Wolf shifts) obtained from a real image of a point source.