Author: RCA Corporation. Solid State DivisionPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 682
Book Description
RCA COS/MOS Integrated Circuits
Author: RCA Corporation. Solid State DivisionPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 682
Book Description
RCA COS/MOS integrated circuits
Author: RCA Solid stateRCA COS/MOS Integrated Circuits
Author: Bipolar and MOS Analog Integrated Circuit Design
Author: Alan B. GrebenePublisher: John Wiley & Sons
ISBN: 0471430781
Category : Technology & Engineering
Languages : en
Pages : 914
Book Description
A practical, engineering book discussing the most modern and general techniques for designing analog integrated circuits which are not digital (excluding computer circuits). Covers the basics of the devices, manufacturing technology, design procedures, shortcuts, and analytic techniques. Includes examples and illustrations of the best current practice.
RCA Engineer
Author: Publisher:
ISBN:
Category : Electronic industries
Languages : en
Pages : 668
Book Description
COS/MOS Integrated Circuits
Author: RCA.A Handbook on Biotelemetry and Radio Tracking
Author: Charles J. AmlanerPublisher: Elsevier
ISBN: 1483189317
Category : Science
Languages : en
Pages : 825
Book Description
A Handbook on Biotelemetry and Radio Tracking presents the proceedings of an International Conference on Telemetry and Radio Tracking in Biology and Medicine, held in The University of Oxford, Oxford, U.K. on March 20–22, 1979. This book illustrates the advances connected with every aspect of biotelemetry and radio tracking. Organized into five parts encompassing 101 chapters, this compilation of papers begins with an overview of the method that allows assessment or control of biological parameters from animals, subjects, and patients with comparatively little disturbance and restraint. This text then examines radio telemetry as a system for telemetry or communications over great distances. Other chapters consider better transmitter design and construction of radio tracking. This book discusses as well telemetric measurements of hemodynamic response to driving in coronary patients. The final chapter deals with the study of the coastal movements of Atlantic salmon tagged with ultrasonic transmitters. This book is a valuable resource for biological researchers and ecologists.
IDDQ Testing of VLSI Circuits
Author: Ravi K. GulatiPublisher: Springer Science & Business Media
ISBN: 1461531462
Category : Computers
Languages : en
Pages : 121
Book Description
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Comprehensive Test Pattern and Approach for Characterizing SOS Technology
Author: William E. HamPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 388
Book Description
COS/MOS Integrated Circuits Manual
Author: RCA Corporation. Solid State DivisionPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 160
Book Description