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Author: Young J. Chiang Publisher: SAE International ISBN: 1468607707 Category : Computers Languages : en Pages : 398
Book Description
Failure modes and effects analysis (FMEA); Reliability; Product Development; Design Process; Test Procedures "Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International’s DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability." (ISBN 9781468607703 ISBN 9781468607697 ISBN 9781468607727 DOI 10.4271/9781468607697)
Author: Young J. Chiang Publisher: SAE International ISBN: 1468607707 Category : Computers Languages : en Pages : 398
Book Description
Failure modes and effects analysis (FMEA); Reliability; Product Development; Design Process; Test Procedures "Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International’s DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability." (ISBN 9781468607703 ISBN 9781468607697 ISBN 9781468607727 DOI 10.4271/9781468607697)
Author: Young J. Chiang Publisher: SAE International ISBN: 1468606026 Category : Computers Languages : en Pages : 358
Book Description
In a world where innovation and sustainability are paramount, Fundamentals of Design of Experiments for Automotive Engineering: Volume I serves as a definitive guide to harnessing the power of statistical thinking in product development. As first of four volumes in SAE International’s DOE for Product Reliability Growth series, this book presents a practical, application-focused approach by emphasizing DOE as a dynamic tool for automotive engineers. It showcases real-world examples, demonstrating how process improvements and system optimizations can significantly enhance product reliability. The author, Yung Chiang, leverages extensive product development expertise to present a comprehensive process that ensures product performance and reliability throughout its entire lifecycle. Whether individuals are involved in research, design, testing, manufacturing, or marketing, this essential reference equips them with the skills needed to excel in their respective roles. This book explores the potential of Reliability and Sustainability with DOE, featuring the following topics: - Fundamental prerequisites for deploying DOE: Product reliability processes, measurement uncertainty, failure analysis, and design for reliability. - Full factorial design 2K: A system identification tool for relating objectives to factors and understanding main and interactive effects. - Fractional factorial design 2RK-P: Ideal for identifying main effects and 2-factor interactions. - General fractional factorial design LK-P: Systematically identification of significant inputs and analysis of nonlinear behaviors. - Composite designs as response surface methods: Resolving interactions and optimizing decisions with limited factors. - Adapting to practical challenges with “short” DOE: Leveraging optimization schemes like D-optimality, and A-optimality for optimal results. Readers are encouraged not to allow product failures to hinder progress but to embrace the "statistical thinking" embedded in DOE. This book can illuminate the path to designing products that stand the test of time, resulting in satisfied customers and thriving businesses. (ISBN 9781468606027, ISBN 9781468606034, ISBN 9781468606041, DOI 10.4271/9781468606034)
Author: Young J. Chiang Publisher: SAE International ISBN: 1468607693 Category : Computers Languages : en Pages : 398
Book Description
Failure modes and effects analysis (FMEA); Reliability; Product Development; Design Process; Test Procedures "Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International’s DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability." (ISBN 9781468607703 ISBN 9781468607697 ISBN 9781468607727 DOI 10.4271/9781468607697)
Author: U. Chandrasekhar Publisher: Springer ISBN: 9811327181 Category : Technology & Engineering Languages : en Pages : 541
Book Description
This book gathers the best articles presented by researchers and industrial experts at the International Conference on “Innovative Design and Development Practices in Aerospace and Automotive Engineering (I-DAD 2018)”. The papers discuss new design concepts, analysis and manufacturing technologies, with an emphasis on achieving improved performance by downsizing; improving the weight-to-strength ratio, fuel efficiency, and operational capability at room and elevated temperatures; reducing wear and tear; and addressing NVH aspects, while balancing the challenges of Euro IV/Barat Stage IV emission norms and beyond, greenhouse effects, and recyclable materials. The innovative methods discussed here offer valuable reference material for educational and research organizations, as well as industry, encouraging them to pursue challenging projects of mutual interest.
Author: Amaresh Chakrabarti Publisher: Springer Nature ISBN: 9811601194 Category : Technology & Engineering Languages : en Pages : 989
Book Description
This book showcases cutting-edge research papers from the 8th International Conference on Research into Design (ICoRD 2021) written by eminent researchers from across the world on design processes, technologies, methods and tools, and their impact on innovation, for supporting design for a connected world. The theme of ICoRD‘21 has been “Design for Tomorrow”. The world as we know it in our times is increasingly becoming connected. In this interconnected world, design has to address new challenges of merging the cyber and the physical, the smart and the mundane, the technology and the human. As a result, there is an increasing need for strategizing and thinking about design for a better tomorrow. The theme for ICoRD’21 serves as a provocation for the design community to think about rapid changes in the near future to usher in a better tomorrow. The papers in this book explore these themes, and their key focus is design for tomorrow: how are products and their development be addressed for the immediate pressing needs within a connected world? The book will be of interest to researchers, professionals and entrepreneurs working in the areas on industrial design, manufacturing, consumer goods, and industrial management who are interested in the new and emerging methods and tools for design of new products, systems and services.
Author: C.-H. Chen Publisher: IOS Press ISBN: 1614997799 Category : Technology & Engineering Languages : en Pages : 1092
Book Description
Concurrent Engineering is based on the concept that different phases of a product life cycle should be conducted concurrently and initiated as early as possible within the Product Creation Process (PCP). Its main goal is to increase the efficiency and effectiveness of the PCP and reduce errors in the later stages, and to incorporate considerations for the full lifecycle, through-life operations, and environmental issues of the product. It has become the substantive basic methodology in many industries, and the initial basic concepts have matured and become the foundation of many new ideas, methodologies, initiatives, approaches and tools. This book presents the proceedings of the 24th ISPE Inc. International Conference on Transdisciplinary (formerly: Concurrent) Engineering (TE 2017), held in Singapore, in July 2017. The 120 peer-reviewed papers in the book are divided into 16 sections: air transport and traffic operations and management; risk-aware supply chain intelligence; product innovation and marketing management; human factors in design; human engineering; design methods and tools; decision supporting tools and methods; concurrent engineering; knowledge-based engineering; collaborative engineering; engineering for sustainability; service design; digital manufacturing; design automation; artificial intelligence and data analytics; smart systems and the Internet of Things. The book provides a comprehensive overview of recent advances in transdisciplinary concurrent engineering research and applications, and will be of interest to researchers, design practitioners and educators working in the field.
Author: Lev M. Klyatis Publisher: Academic Press ISBN: 0128188413 Category : Technology & Engineering Languages : en Pages : 358
Book Description
Accelerated testing (most types of laboratory testing, proving ground testing, intensive field/flight testing, any experimental research) is increasingly a key component for predicting of product's/process performance. Trends in Development Accelerated Testing for Automotive and Aerospace Engineering provides a completely updated analysis of the current status of accelerated testing, including the basic general directions of testing (methods and equipment) development, how one needs to study real world conditions for their accurate simulation and successful accelerated testing, describes in details the role of accurate simulation in the development of automotive and aerospace engineering, shows that failures are most often found in the interconnections, step-by-step instructions and examples. This is the only book presently available that considers in detail both the positive and negative trends in testing development for prediction quality, reliability, safety, durability, maintainability, supportability, profit, and decreasing life-cycle cost, recalls, complaints and other performance components of the product. The author presents new ideas and offers a unique strategic approach to obtaining solutions which were not possible using earlier. His methodology has been widely implemented, continue to be adopted throughout the world, and leads to advance society through product improvement that can reduce loss of life, injuries, financial losses, and product recalls. It also covers new ideas in development positive and cost- effective trends in testing development, especially accelerated reliability and durability testing (ART/ADT), which includes integration accurate simulation of field/flight influences, safety, human factors, and leads to successful prediction of product performance during pre-design, design, manufacturing, and usage for the product's service life. Engineers, researchers, teachers and postgraduate/advanced students who are involved in automotive and aerospace engineering will find this a useful reference on how to apply the accelerated testing method to solve practical problems in these areas.
Author: Young J. Chiang
Author: Young J. Chiang
Author: Young J. Chiang
Author: Young J. Chiang
Author: U. Chandrasekhar
Author: Amaresh Chakrabarti
Author: C.-H. Chen
Author: 
Author: 
Author: 
Author: Lev M. Klyatis