Author: S. N. G. ChuPublisher: The Electrochemical Society
ISBN: 9781566770934
Category : Technology & Engineering
Languages : en
Pages : 324
Book Description
Proceedings of the Twenty-First State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXI)
Author: S. N. G. ChuPublisher: The Electrochemical Society
ISBN: 9781566770934
Category : Technology & Engineering
Languages : en
Pages : 324
Book Description
Proceedings of the Twenty-Seventh State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXVII)
Author: S. N. G. ChuPublisher: The Electrochemical Society
ISBN: 9781566771498
Category : Technology & Engineering
Languages : en
Pages : 408
Book Description
American Book Publishing Record
Author: Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1222
Book Description
State-of-the-Art Program on Compound Semiconductors (SOTAPOCs XXX)
Author: C. R. AbernathyPublisher: The Electrochemical Society
ISBN: 9781566772266
Category : Technology & Engineering
Languages : en
Pages : 278
Book Description
Proceedings of the Symposium on High Speed III-V Electronics for Wireless Applications and the Twenty-Fifth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXV)
Author: F. RenPublisher: The Electrochemical Society
ISBN: 9781566771658
Category : Science
Languages : en
Pages : 364
Book Description
Defects in Electronic Materials II: Volume 442
Author: Jürgen MichelPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 744
Book Description
The pervasive role of defects in determining the thermal, mechanical, electrical, optical and magnetic properties of materials is significant as is the knowledge and operation of generation and control of defects in electronic materials. Developing novel semiconductor materials, however, requires new insights into the role of defects to achieve new properties. New experimental techniques must be developed to study defects in small structures. Research groups come together in this book from MRS to provide a vivid picture of the current problems, progress and methods in defect studies in electronic materials. Topics include new techniques in defect studies; processing induced defects, plasma-induced point defects; processing induced defects -defects and gate-oxide integrity; point defects and reaction; point defects and interactions in Si; impurity diffusion and hydrogen in Si; dislocations in group IV semiconductors; point defects and defect interactions in SiGe; point defects in III-V compounds; compensation and structural defects in III-V compounds and layers and structures.
Proceedings of the Symposium on Wide Bandgap Semiconductors and Devices and the Twenty-Third State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXIII)
Author: F. RenPublisher: The Electrochemical Society
ISBN: 9781566771160
Category : Technology & Engineering
Languages : en
Pages : 524
Book Description
Deep UV Laser Stimulated Organometallic Vapor Phase Epitaxy
Author: Andreas WankerlRF and Microwave Semiconductor Device Handbook
Author: Mike GolioPublisher: CRC Press
ISBN: 135183620X
Category : Technology & Engineering
Languages : en
Pages : 448
Book Description
Offering a single volume reference for high frequency semiconductor devices, this handbook covers basic material characteristics, system level concerns and constraints, simulation and modeling of devices, and packaging. Individual chapters detail the properties and characteristics of each semiconductor device type, including: Varactors, Schottky diodes, transit-time devices, BJTs, HBTs, MOSFETs, MESFETs, and HEMTs. Written by leading researchers in the field, the RF and Microwave Semiconductor Device Handbook provides an excellent starting point for programs involving development, technology comparison, or acquisition of RF and wireless semiconductor devices.
The RF and Microwave Handbook - 3 Volume Set
Author: Mike GolioPublisher: CRC Press
ISBN: 1439833230
Category : Technology & Engineering
Languages : en
Pages : 2208
Book Description
By 1990 the wireless revolution had begun. In late 2000, Mike Golio gave the world a significant tool to use in this revolution: The RF and Microwave Handbook. Since then, wireless technology spread across the globe with unprecedented speed, fueled by 3G and 4G mobile technology and the proliferation of wireless LANs. Updated to reflect this tremendous growth, the second edition of this widely embraced, bestselling handbook divides its coverage conveniently into a set of three books, each focused on a particular aspect of the technology. Six new chapters cover WiMAX, broadband cable, bit error ratio (BER) testing, high-power PAs (power amplifiers), heterojunction bipolar transistors (HBTs), as well as an overview of microwave engineering. Over 100 contributors, with diverse backgrounds in academic, industrial, government, manufacturing, design, and research reflect the breadth and depth of the field. This eclectic mix of contributors ensures that the coverage balances fundamental technical issues with the important business and marketing constraints that define commercial RF and microwave engineering. Focused chapters filled with formulas, charts, graphs, diagrams, and tables make the information easy to locate and apply to practical cases. The new format, three tightly focused volumes, provides not only increased information but also ease of use. You can find the information you need quickly, without wading through material you don’t immediately need, giving you access to the caliber of data you have come to expect in a much more user-friendly format.