Author:
Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 420
Book Description
The ... IEEE Asia Pacific Conference on ASICs
Author:
Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 420
Book Description
Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 420
Book Description
Integrated Circuit Test Engineering
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Proceedings
Advanced VLSI Design and Testability Issues
Author: Suman Lata Tripathi
Publisher: CRC Press
ISBN: 1000168158
Category : Technology & Engineering
Languages : en
Pages : 379
Book Description
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.
Publisher: CRC Press
ISBN: 1000168158
Category : Technology & Engineering
Languages : en
Pages : 379
Book Description
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.
Electronics for Radiation Detection
Author: Krzysztof Iniewski
Publisher: CRC Press
ISBN: 1439858845
Category : Medical
Languages : en
Pages : 384
Book Description
There is a growing need to understand and combat potential radiation damage problems in semiconductor devices and circuits. Assessing the billion-dollar market for detection equipment in the context of medical imaging using ionizing radiation, Electronics for Radiation Detection presents valuable information that will help integrated circuit (IC) designers and other electronics professionals take full advantage of the tremendous developments and opportunities associated with this burgeoning field. Assembling contributions from industrial and academic experts, this book— Addresses the state of the art in the design of semiconductor detectors, integrated circuits, and other electronics used in radiation detection Analyzes the main effects of radiation in semiconductor devices and circuits, paying special attention to degradation observed in MOS devices and circuits when they are irradiated Explains how circuits are built to deal with radiation, focusing on practical information about how they are being used, rather than mathematical details Radiation detection is critical in space applications, nuclear physics, semiconductor processing, and medical imaging, as well as security, drug development, and modern silicon processing techniques. The authors discuss new opportunities in these fields and address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches. Aimed at postgraduate researchers and practicing engineers, this book is a must for those serious about improving their understanding of electronics used in radiation detection. The information presented here can help you make optimal use of electronic detection equipment and stimulate further interest in its development, use, and benefits.
Publisher: CRC Press
ISBN: 1439858845
Category : Medical
Languages : en
Pages : 384
Book Description
There is a growing need to understand and combat potential radiation damage problems in semiconductor devices and circuits. Assessing the billion-dollar market for detection equipment in the context of medical imaging using ionizing radiation, Electronics for Radiation Detection presents valuable information that will help integrated circuit (IC) designers and other electronics professionals take full advantage of the tremendous developments and opportunities associated with this burgeoning field. Assembling contributions from industrial and academic experts, this book— Addresses the state of the art in the design of semiconductor detectors, integrated circuits, and other electronics used in radiation detection Analyzes the main effects of radiation in semiconductor devices and circuits, paying special attention to degradation observed in MOS devices and circuits when they are irradiated Explains how circuits are built to deal with radiation, focusing on practical information about how they are being used, rather than mathematical details Radiation detection is critical in space applications, nuclear physics, semiconductor processing, and medical imaging, as well as security, drug development, and modern silicon processing techniques. The authors discuss new opportunities in these fields and address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches. Aimed at postgraduate researchers and practicing engineers, this book is a must for those serious about improving their understanding of electronics used in radiation detection. The information presented here can help you make optimal use of electronic detection equipment and stimulate further interest in its development, use, and benefits.
Proceedings of the ... IEEE International Caracas Conference on Devices, Circuits and Systems
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 612
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 612
Book Description
Imaging: Sensors and Technologies
Author: Gonzalo Pajares Martinsanz
Publisher: MDPI
ISBN: 3038423602
Category : Computers
Languages : en
Pages : 635
Book Description
This book is a printed edition of the Special Issue "Imaging: Sensors and Technologies" that was published in Sensors
Publisher: MDPI
ISBN: 3038423602
Category : Computers
Languages : en
Pages : 635
Book Description
This book is a printed edition of the Special Issue "Imaging: Sensors and Technologies" that was published in Sensors
Fault-Tolerance Techniques for Spacecraft Control Computers
Author: Mengfei Yang
Publisher: John Wiley & Sons
ISBN: 1119107415
Category : Computers
Languages : en
Pages : 430
Book Description
Comprehensive coverage of all aspects of space application oriented fault tolerance techniques • Experienced expert author working on fault tolerance for Chinese space program for almost three decades • Initiatively provides a systematic texts for the cutting-edge fault tolerance techniques in spacecraft control computer, with emphasis on practical engineering knowledge • Presents fundamental and advanced theories and technologies in a logical and easy-to-understand manner • Beneficial to readers inside and outside the area of space applications
Publisher: John Wiley & Sons
ISBN: 1119107415
Category : Computers
Languages : en
Pages : 430
Book Description
Comprehensive coverage of all aspects of space application oriented fault tolerance techniques • Experienced expert author working on fault tolerance for Chinese space program for almost three decades • Initiatively provides a systematic texts for the cutting-edge fault tolerance techniques in spacecraft control computer, with emphasis on practical engineering knowledge • Presents fundamental and advanced theories and technologies in a logical and easy-to-understand manner • Beneficial to readers inside and outside the area of space applications
VLSI, Microwave and Wireless Technologies
Author: Brijesh Mishra
Publisher: Springer Nature
ISBN: 9811903123
Category : Technology & Engineering
Languages : en
Pages : 790
Book Description
This book comprises the proceedings of the International Conference on VLSI & Microwave and Wireless Technologies (ICVMWT-2021). The book includes peer-reviewed papers on the core technological developments in emerging fields like wireless communication, RF microwave/radar, VLSI, optical communication, etc. The book will serve as a valuable reference resource for academics and researchers across the globe.
Publisher: Springer Nature
ISBN: 9811903123
Category : Technology & Engineering
Languages : en
Pages : 790
Book Description
This book comprises the proceedings of the International Conference on VLSI & Microwave and Wireless Technologies (ICVMWT-2021). The book includes peer-reviewed papers on the core technological developments in emerging fields like wireless communication, RF microwave/radar, VLSI, optical communication, etc. The book will serve as a valuable reference resource for academics and researchers across the globe.
Index of Conference Proceedings
Author: British Library. Document Supply Centre
Publisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 870
Book Description
Publisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 870
Book Description