Author: Junichi Murota
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
ISCSI-V - Proceedings of the Fifth International Symposium on Control of Semiconductor Interfaces
Proceedings of the Fifth International Symposium on Control of Semiconductor Interfaces
ISCSI-V
Proceedings of the Fifth International Symposium on Quantum Confinement, Nanostructures
Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
Author: Jerzy Rużyłło
Publisher: The Electrochemical Society
ISBN: 9781566771887
Category : Technology & Engineering
Languages : en
Pages : 668
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566771887
Category : Technology & Engineering
Languages : en
Pages : 668
Book Description
Control of Semiconductor Interfaces
Author: Iwao Ohdomari
Publisher: Elsevier Publishing Company
ISBN: 9780444818898
Category : Science
Languages : en
Pages : 583
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in...
Publisher: Elsevier Publishing Company
ISBN: 9780444818898
Category : Science
Languages : en
Pages : 583
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in...
ICFSI-5
Proceedings of the Second International Symposium on the Control of Semiconductor Interfaces
Author: ISCSI. 2, 1996, Karuizawa
Publisher:
ISBN:
Category :
Languages : en
Pages : 856
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 856
Book Description
Proceedings of the Fourth International Symposium on the Control of Semiconductor Interfaces
Control of Semiconductor Interfaces
Author: I. Ohdomari
Publisher: Elsevier
ISBN: 1483290484
Category : Science
Languages : en
Pages : 600
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Publisher: Elsevier
ISBN: 1483290484
Category : Science
Languages : en
Pages : 600
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.