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Proceedings of the 51st Annual Conference on Applications of X-ray Analysis

Author:
Publisher:
ISBN:
Category : X-rays
Languages : en
Pages :

Book Description

Proceedings of the 51st Annual Conference on Applications of X-ray Analysis

Author:
Publisher:
ISBN:
Category : X-rays
Languages : en
Pages :

Book Description

Advances in X-ray Analysis

Author: International Centre for Diffraction Data
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description

Advances in X-ray Analysis

Author: International Centre for Diffraction Data
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description

Proceedings of the 51st Annual Conference on Applications of X-Ray Analysis

Author: Optical Archives Inc. (Laguna, Calif.)
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description

Advances in X-Ray Analysis

Author: William M. Mueller
Publisher: Springer
ISBN: 9780306381027
Category : Science
Languages : en
Pages : 353

Book Description
The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.

Advances in X-Ray Analysis

Author: William M. Mueller
Publisher: Springer
ISBN: 9781468476088
Category : Science
Languages : en
Pages : 564

Book Description
The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.