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Author: Matthias M. Karow Publisher: Cuvillier Verlag ISBN: 3736966261 Category : Technology & Engineering Languages : en Pages : 143
Book Description
ndustrial laser systems for material processing applications rely on the availability of highly efficient, high-brightness diode lasers. GaAs-based broad-area laser bars play a vital role in such applications as pump sources for high-beam-quality solid-state lasers and, increasingly, as direct processing tools. This work studies 940 nm-laser bars emitting 1 kW optical power at room temperature, identifying those physical mechanisms that are currently limiting electrical-to-optical conversion efficiency as well as lateral beam quality. In the process, several diagnostic studies on bars with varied lateral-longitudinal design were carried out. The effects of technological measures for performance optimization were analyzed, yielding a new benchmark in efficiency and lateral divergence. The studies into altered resonator lengths of 4 and 6 mm as well as fill factors between 69 and 87 % successfully reduce both the voltage dropping across the device and power saturation at high currents, enabling 66 % efficiency at the operation point. Concrete measures how to reach efficiencies ≥70 % are presented thereafter, showing that doubling the efficiency value of the first 1 kW-demonstration in 2007 – amounting to 35 % – is in near reach. Investigation of the beam quality bases on a herein proposed and realized concept, in which the far field is resolved for each individual bar emitter. In this way, it is possible to determine how far-field profiles vary along the bar width and how much these variations affect the overall bar far-field. Further, such effects specific to bar structures can be separated into non-thermal and thermal influences. The effect of mechanical chip deformation (bar smile) as well as neighboring-emitter interaction has been investigated for the first time in active kW-class devices, yielding a lateral divergence as low as 8.8° at the operation point.
Author: Matthias M. Karow Publisher: Cuvillier Verlag ISBN: 3736966261 Category : Technology & Engineering Languages : en Pages : 143
Book Description
ndustrial laser systems for material processing applications rely on the availability of highly efficient, high-brightness diode lasers. GaAs-based broad-area laser bars play a vital role in such applications as pump sources for high-beam-quality solid-state lasers and, increasingly, as direct processing tools. This work studies 940 nm-laser bars emitting 1 kW optical power at room temperature, identifying those physical mechanisms that are currently limiting electrical-to-optical conversion efficiency as well as lateral beam quality. In the process, several diagnostic studies on bars with varied lateral-longitudinal design were carried out. The effects of technological measures for performance optimization were analyzed, yielding a new benchmark in efficiency and lateral divergence. The studies into altered resonator lengths of 4 and 6 mm as well as fill factors between 69 and 87 % successfully reduce both the voltage dropping across the device and power saturation at high currents, enabling 66 % efficiency at the operation point. Concrete measures how to reach efficiencies ≥70 % are presented thereafter, showing that doubling the efficiency value of the first 1 kW-demonstration in 2007 – amounting to 35 % – is in near reach. Investigation of the beam quality bases on a herein proposed and realized concept, in which the far field is resolved for each individual bar emitter. In this way, it is possible to determine how far-field profiles vary along the bar width and how much these variations affect the overall bar far-field. Further, such effects specific to bar structures can be separated into non-thermal and thermal influences. The effect of mechanical chip deformation (bar smile) as well as neighboring-emitter interaction has been investigated for the first time in active kW-class devices, yielding a lateral divergence as low as 8.8° at the operation point.
Author: Christian Brecher Publisher: Springer Nature ISBN: 3031444973 Category : Technology & Engineering Languages : en Pages : 537
Book Description
This seminal compendium, available through open access, illuminates the forefront of digital collaboration in production. It introduces the visionary concept of the Internet of Production (IoP), an ambitious initiative by Germany's esteemed Cluster of Excellence at RWTH Aachen University. This handbook pioneers the integration of data, models, and knowledge across development, production, and user cycles, offering interdisciplinary insights into production technology's horizons with the overall objective to create a worldwide lab. The work is organized into seven key parts, each contributing to a comprehensive understanding of the IoP. Part I lays the foundation with interdisciplinary visions and concepts. Part II delves into IoP's infrastructure, encompassing digital shadows and actionable artificial intelligence. Part III examines materials within the digitalized production landscape. Part IV confronts the challenges and potentials of production processes under novel digitalization methods. Part V focuses on production management with data-driven decision support, while Part VI explores agile development processes. Finally, Part VII delves into the interplay between internal and external perspectives in the IoP, human-centered work design, and platform-based ecosystems. Supported by the German Research Foundation (DFG), this compendium redefines manufacturing through the transformative IoP lens. Embrace this scholarly endeavor to embrace technological advancement. This is an open access book.
Author: Massimo Vanzi Publisher: Elsevier ISBN: 0081010893 Category : Technology & Engineering Languages : en Pages : 270
Book Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Author: Joachim Piprek Publisher: CRC Press ISBN: 1498749577 Category : Science Languages : en Pages : 887
Book Description
Provides a comprehensive survey of fundamental concepts and methods for optoelectronic device modeling and simulation. Gives a broad overview of concepts with concise explanations illustrated by real results. Compares different levels of modeling, from simple analytical models to complex numerical models. Discusses practical methods of model validation. Includes an overview of numerical techniques.
Author: IEEE Staff Publisher: ISBN: 9781467391795 Category : Languages : en Pages :
Book Description
This conference is the premier annual event addressing the latest advances in diode and diode pumped laser technology and systems applications The conference covers laser pump diodes diode pumped solid state and fibre lasers applications of diode laser technology in consumer products, processing, healthcare and biophotonics, defence and security
Author: Bhaskar Dutta Publisher: Elsevier ISBN: 0128166436 Category : Technology & Engineering Languages : en Pages : 355
Book Description
Science, Technology and Applications of Metal Additive Manufacturing provides a holistic picture of metal Additive Manufacturing (AM) that encompasses the science, technology and applications for the use of metal AM. Users will find design aspects, various metal AM technologies commercially available, a focus on merits and demerits, implications for qualification and certification, applications, cost modeling of AM, and future directions. This book serves as an educational guide, providing a holistic picture of metal AM that encompasses science, technology and applications for the real-life use of metal AM. - Includes an overall understanding of metal additive manufacturing, Including steps involved (process flow) - Discusses available commercial metal AM technologies and their relative strengths and weaknesses - Reviews the process of qualification of AM parts, various applications, cost modeling, and the future directions of metal AM
Author: Hermann Kolanoski Publisher: Oxford University Press ISBN: 0191899232 Category : Science Languages : en Pages : 949
Book Description
This book describes the fundamentals of particle detectors as well as their applications. Detector development is an important part of nuclear, particle and astroparticle physics, and through its applications in radiation imaging, it paves the way for advancements in the biomedical and materials sciences. Knowledge in detector physics is one of the required skills of an experimental physicist in these fields. The breadth of knowledge required for detector development comprises many areas of physics and technology, starting from interactions of particles with matter, gas- and solid-state physics, over charge transport and signal development, to elements of microelectronics. The book's aim is to describe the fundamentals of detectors and their different variants and implementations as clearly as possible and as deeply as needed for a thorough understanding. While this comprehensive opus contains all the materials taught in experimental particle physics lectures or modules addressing detector physics at the Master's level, it also goes well beyond these basic requirements. This is an essential text for students who want to deepen their knowledge in this field. It is also a highly useful guide for lecturers and scientists looking for a starting point for detector development work.
Author: Matthias M. Karow 
Author: Matthias M. Karow 
Author: Zhi-Han Zhu
Author: Christian Brecher
Author: Massimo Vanzi
Author: Joachim Piprek
Author: IEEE Staff
Author: IEEE Staff
Author: Bhaskar Dutta
Author: 
Author: Hermann Kolanoski