Author: Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 236
Book Description
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
Author: 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
Author: IEEE StaffPublisher:
ISBN: 9781479986316
Category :
Languages : en
Pages :
Book Description
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2015)
Author: Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Author: Publisher:
ISBN: 9781479961559
Category : Fault-tolerant computing
Languages : en
Pages : 304
Book Description
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
Author: Proceedings of SIE 2023
Author: Carmine CiofiPublisher: Springer Nature
ISBN: 3031487117
Category : Technology & Engineering
Languages : en
Pages : 469
Book Description
This book showcases the state of the art in the field of electronics, as presented by researchers and engineers at the 54th Annual Meeting of the Italian Electronics Society (SIE), held in Noto (SR), Italy, on September 6–8, 2023. It covers a broad range of aspects, including: integrated circuits and systems, micro- and nano-electronic devices, microwave electronics, sensors and microsystems, optoelectronics and photonics, power electronics, electronic systems and applications.
Proceedings of International Conference on Communication, Circuits, and Systems
Author: Sukanta Kumar SabutPublisher: Springer Nature
ISBN: 9813348666
Category : Computers
Languages : en
Pages : 575
Book Description
The book proposes new technologies and discusses innovative solutions to various problems in the field of communication, circuits, and systems, as reflected in high-quality papers presented at International Conference on Communication, Circuits, and Systems (IC3S 2020) held at KIIT, Bhubaneswar, India from 16 – 18 October 2020. It brings together new works from academicians, scientists, industry professionals, scholars, and students together to exchange research outcomes and open up new horizons in the areas of signal processing, communications, and devices.
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Author: Publisher:
ISBN: 9781479915835
Category : Integrated circuits
Languages : en
Pages :
Book Description
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Author: IEEE StaffPublisher:
ISBN: 9781509036240
Category :
Languages : en
Pages :
Book Description
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Author: Publisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages :
Book Description