Author: International Test ConferencePublisher:
ISBN: 9780780329911
Category :
Languages : en
Pages :
Book Description
Proceedings International Test Conference 1995
Author: Proceedings
Author: International Test ConferencePublisher:
ISBN: 9780780329911
Category :
Languages : en
Pages :
Book Description
International Test Conference 1995
Author: Proceedings, International Test Conference 1997
Author: Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1074
Book Description
Driving Down the Cost of Test
Author: Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 1011
Book Description
International Test Conference 1995
Author: Proceedings
Author: International Test ConferencePublisher:
ISBN: 9780780329911
Category :
Languages : en
Pages :
Book Description
Introduction to IDDQ Testing
Author: S. ChakravartyPublisher: Springer Science & Business Media
ISBN: 146156137X
Category : Technology & Engineering
Languages : en
Pages : 336
Book Description
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Author: Manoj SachdevPublisher: Springer Science & Business Media
ISBN: 0387465472
Category : Technology & Engineering
Languages : en
Pages : 343
Book Description
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Sensors Fault Diagnosis Trends and Applications
Author: Piotr WitczakPublisher: MDPI
ISBN: 3036510486
Category : Technology & Engineering
Languages : en
Pages : 236
Book Description
Fault diagnosis has always been a concern for industry. In general, diagnosis in complex systems requires the acquisition of information from sensors and the processing and extracting of required features for the classification or identification of faults. Therefore, fault diagnosis of sensors is clearly important as faulty information from a sensor may lead to misleading conclusions about the whole system. As engineering systems grow in size and complexity, it becomes more and more important to diagnose faulty behavior before it can lead to total failure. In the light of above issues, this book is dedicated to trends and applications in modern-sensor fault diagnosis.