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Proceedings ... Annual Meeting, Microscopy Society of America

Proceedings ... Annual Meeting, Microscopy Society of America PDF Author: Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 1292

Book Description


Proceedings ... Annual Meeting, Microscopy Society of America

Proceedings ... Annual Meeting, Microscopy Society of America PDF Author: Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 1292

Book Description


Proceedings, ... Annual Meeting, Electron Microscopy Society of America

Proceedings, ... Annual Meeting, Electron Microscopy Society of America PDF Author: Electron Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 650

Book Description


The Growth of Electron Microscopy

The Growth of Electron Microscopy PDF Author:
Publisher: Academic Press
ISBN: 0080577628
Category : Science
Languages : en
Pages : 919

Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Index of NLM Serial Titles

Index of NLM Serial Titles PDF Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1584

Book Description
A keyword listing of serial titles currently received by the National Library of Medicine.

Current Catalog

Current Catalog PDF Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1000

Book Description
Includes subject section, name section, and 1968-1970, technical reports.

Tough Composite Materials

Tough Composite Materials PDF Author:
Publisher:
ISBN:
Category : Airplanes
Languages : en
Pages : 404

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160

Book Description


Practical Scanning Electron Microscopy

Practical Scanning Electron Microscopy PDF Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Category : Technology & Engineering
Languages : en
Pages : 598

Book Description
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Fungal Bioremediation

Fungal Bioremediation PDF Author: Araceli Tomasini Campocosio
Publisher: CRC Press
ISBN: 1351795651
Category : Science
Languages : en
Pages : 292

Book Description
This book highlights the role fungi play in bioremediation, as well as the mechanisms and enzymes involved in this process. It covers the application of bioremediation with fungi in polluted sites and gives a wide overview of the main applications of remediation, such as degradation of xenobiotics, gaseous pollutants, and metal reduction. The book explains the degradation of emergent pollutants and radioactive compounds by fungi, which is relevant to the current pollution problems that have been studied over the last few decades. The book also describes the most advanced techniques and tools that are currently used in this field of study.