Author: William L. BaunPublisher:
ISBN:
Category : Dispersing agents
Languages : en
Pages : 38
Book Description
Preparation and Use of Organic Compounds as Dispersing Devices for Long Wavelength X Rays
Author: William L. BaunPublisher:
ISBN:
Category : Dispersing agents
Languages : en
Pages : 38
Book Description
Technical Abstract Bulletin
Author: Defense Documentation Center (U.S.)Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1032
Book Description
U.S. Government Research Reports
Author: U.S. Government Research Reports
Author: A Review of the Air Force Materials Research and Development Program
Author: Air Force Materials Laboratory (U.S.)Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 294
Book Description
Technical reports published by the Air Force Materials Laboratoy during the period 1 July 1962 - 30 June 1963 are abstracted herein. Reports on reseqrch conducted by the Air Force Materials Laboratory personnel as well as that conducted on contract are included. These reports cover basic and applied research in the materials area being conducted by the Metals and Ceramics Division, Non-metallic Materials Division, Materials Physics Division, Manufacturing Technology Division, and Materials Applications Division of the Air Force Materials Laboratory.
A Review of the Air Force Materials Research and Development Program
Author: United States. Wright Air Development DivisionPublisher:
ISBN:
Category : Materials
Languages : en
Pages : 308
Book Description
National Union Catalog
Author: Publisher:
ISBN:
Category : Catalogs, Union
Languages : en
Pages : 1032
Book Description
Includes entries for maps and atlases.
U.S. Government Research and Development Reports
Author: Principles and Practice of X-Ray Spectrometric Analysis
Author: E.P. BertinPublisher: Springer Science & Business Media
ISBN: 1461344166
Category : Science
Languages : en
Pages : 1098
Book Description
Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.
Advances in X-Ray Analysis
Author: Gavin R. MallettPublisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.