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Author: R. Reisfeld Publisher: ISBN: Category : Languages : en Pages : 41
Book Description
Thin glass films prepared by the sol-gel method were deposited on glass supports. Divalent cobalt and divalent copper were used as optical probes for changes in the glass formation and re-arrangement of the silicate groups during the heat-treatments whereby the cobalt ion initially octahedrally coordinated was transformed into lower coordination as a result of elimination of water and increase of density of the glass. Divalent copper is also effective in infrared absorption and silver particles embedded in the films form narrow-band absorbing filter. Characterization of surfaces of thin films applied in coatings for lasers and laser windows is important in understanding and preventing damage of these materials. (jes).
Author: R. Reisfeld Publisher: ISBN: Category : Languages : en Pages : 41
Book Description
Thin glass films prepared by the sol-gel method were deposited on glass supports. Divalent cobalt and divalent copper were used as optical probes for changes in the glass formation and re-arrangement of the silicate groups during the heat-treatments whereby the cobalt ion initially octahedrally coordinated was transformed into lower coordination as a result of elimination of water and increase of density of the glass. Divalent copper is also effective in infrared absorption and silver particles embedded in the films form narrow-band absorbing filter. Characterization of surfaces of thin films applied in coatings for lasers and laser windows is important in understanding and preventing damage of these materials. (jes).
Author: Manuel P. Soriaga Publisher: Springer Science & Business Media ISBN: 1461507758 Category : Science Languages : en Pages : 362
Book Description
This book is about thin films; what they are, how they are prepared, how they are characterized, and what they are used for. The contents of this book not only showcase the diversity of thin films, but also reveals the commonality among the work performed in a variety of areas. The chapters in this volume are based on invited papers presented by prominent researchers in the field at a Symposium on "Thin Films: Preparation, Characterization, Applications" at the 221st National Meeting of the American Chemical Society held in San Diego, California. The coverage of the symposium was extensive; topics ranged from highly-ordered metal adlayers on well-defined electrode surfaces to bio-organic films on non-metallic nanoparticles. An objective of this book is for the readers to be able to draw from the experience and results of others in order to improve and expand the understanding of the science and technology of their own thin films systems.
Author: Fatma Sarf Publisher: BoD – Books on Demand ISBN: 1837691355 Category : Technology & Engineering Languages : en Pages : 178
Book Description
This book focuses on the growth of nanomaterials as thin films. It covers the recent development of thin films using different techniques, such as electrodeposition. It also discusses the widespread use of electrochemical and magnetic applications. This book brings together multidisciplinary chapters written by leading specialists in the field.
Author: K. N. Tu Publisher: Elsevier ISBN: 1483218295 Category : Technology & Engineering Languages : en Pages : 351
Book Description
Treatise on Materials Science and Technology, Volume 24: Preparation and Properties of Thin Films covers the progress made in the preparation of thin films and the corresponding study of their properties. The book discusses the preparation and property correlations in thin film; the variation of microstructure of thin films; and the molecular beam epitaxy of superlattices in thin film. The text also describes the epitaxial growth of silicon structures (thermal-, laser-, and electron-beam-induced); the characterization of grain boundaries in bicrystalline thin films; and the mechanical properties of thin films on substrates. The ion beam modification of thin film; the use of thin alloy films for metallization in microelectronic devices; and the fabrication and physical properties of ultrasmall structures are also encompassed. Materials scientists and materials engineers will find the book invaluable.
Author: Gertjan Koster Publisher: Elsevier ISBN: 0857094955 Category : Technology & Engineering Languages : en Pages : 295
Book Description
Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques
Author: Gernot Friedbacher Publisher: John Wiley & Sons ISBN: 3527636943 Category : Technology & Engineering Languages : en Pages : 558
Book Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Author: Olaf Stenzel Publisher: Springer ISBN: 3319753258 Category : Science Languages : en Pages : 474
Book Description
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Author: R. Reisfeld
Author: R. Reisfeld
Author: 
Author: Manuel P. Soriaga
Author: Mohammad Jahangir Alam
Author: Fatma Sarf
Author: Duangsamorn Charoenkul
Author: K. N. Tu
Author: Gertjan Koster
Author: Gernot Friedbacher
Author: Olaf Stenzel