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Author: Yip-Wah Chung Publisher: Elsevier ISBN: 0080497780 Category : Science Languages : en Pages : 201
Book Description
Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices. The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time. - Both theory and practice are emphasized - Logical organization allows one to get up to speed on any given topic quickly - Numerous examples, questions for discussion and practice problems are included - The CD includes animation and interactive elements that help to convey difficult concepts
Author: Yip-Wah Chung Publisher: Elsevier ISBN: 0080497780 Category : Science Languages : en Pages : 201
Book Description
Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices. The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time. - Both theory and practice are emphasized - Logical organization allows one to get up to speed on any given topic quickly - Numerous examples, questions for discussion and practice problems are included - The CD includes animation and interactive elements that help to convey difficult concepts
Author: John T. Yates Jr. Publisher: Springer ISBN: 3319176684 Category : Science Languages : en Pages : 637
Book Description
This book is a new edition of a classic text on experimental methods and instruments in surface science. It offers practical insight useful to chemists, physicists, and materials scientists working in experimental surface science. This enlarged second edition contains almost 300 descriptions of experimental methods. The more than 50 active areas with individual scientific and measurement concepts and activities relevant to each area are presented in this book. The key areas covered are: Vacuum System Technology, Mechanical Fabrication Techniques, Measurement Methods, Thermal Control, Delivery of Adsorbates to Surfaces, UHV Windows, Surface Preparation Methods, High Area Solids, Safety. The book is written for researchers and graduate students.
Author: Siegfried Hofmann Publisher: Springer Science & Business Media ISBN: 3642273807 Category : Science Languages : en Pages : 544
Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: Stephen F. Tonkin Publisher: Springer Science & Business Media ISBN: 1447101278 Category : Science Languages : en Pages : 212
Book Description
This book contains everything an amateur astronomer needs to know to begin observing whilst going relatively deeply into the subject for those who are already involved. Covers a very wide range of available equipment, from simple DIY spectroscopes to the most expensive commercially-made instruments. Describes basic principles so that the reader understands how to analyse the spectra he/she sees or records. Contributions by leading amateurs astronomers from the USA and Europe.
Author: Sebastian Schlücker Publisher: John Wiley & Sons ISBN: 3527633065 Category : Science Languages : en Pages : 97
Book Description
Covering everything from the basic theoretical and practical knowledge to new exciting developments in the field with a focus on analytical and life science applications, this monograph shows how to apply surface-enhanced Raman scattering (SERS) for solving real world problems. From the contents: * Theory and practice of SERS * Analytical applications * SERS combined with other analytical techniques * Biophysical applications * Life science applications including various microscopies Aimed at analytical, surface and medicinal chemists, spectroscopists, biophysicists and materials scientists. Includes a Foreword by the renowned Raman spectroscopist Professor Wolfgang Kiefer, the former Editor-in-Chief of the Journal of Raman Spectroscopy.
Author: John F. Watts Publisher: John Wiley & Sons ISBN: 1119417643 Category : Technology & Engineering Languages : en Pages : 320
Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Tze-jer Chuang Publisher: Springer Science & Business Media ISBN: 9781402039515 Category : Technology & Engineering Languages : en Pages : 348
Book Description
This book is derived from the proceedings of the International Workshop on Nanomechanics held at Asilomar Conference Grounds in Pacific Grove, California on July 14-17, 2004. Approximately 70 leading experts from academia, government and industrial sectors in semiconductors, computers, communication, information technology, defense, energy, transportation and aerospace attended the Workshop (see the workshop photo taken on July 16, 2004). The main objective was to convene leading researchers in the nanotechnology community to assess the current state-of-the-art and disseminate recent progress, critical issues, barriers to applications, and directions for future research in nanomechanics. Miniaturization of structural components and functional devices such as electronic, optical, mechanical and electric-magnetic parts has been a recent trend, and the pace has accelerated over the past few years. Advances in micromanufacturing, semiconductor processing (e.g., etching, lithography, grafting, etc.), sensors, actuators and microprocessors have opened up a revolutionary path to the development of new technologies such as micro-electro-mechanical systems (MEMS), nano-electro-mechanical systems (NEMS), micro-engines, smart structures, smart controllers, lab-- a-chip devices, and even bio-medical sensing devices which can detect, analyze, decide and activate appropriate functions in real time. The above-mentioned devices, structures, or systems, have one issue in common. In order to perform their assigned functions, they must maintain their structural integrity and be reliable and durable during their entire designed service life. Thus, strength, durability, and time-dependent mechanical property degradation are major concerns for design engineers and device manufacturers, even though the parts are designed for electronic, magnetic, optical or other functions.
Author: Ali Erdemir Publisher: Elsevier ISBN: 008052530X Category : Technology & Engineering Languages : en Pages : 525
Book Description
Superlubricity is defined as a sliding regime in which friction or resistance to sliding vanishes. It has been shown that energy can be conserved by further reducing/removing friction in moving mechanical systems and this book includes contributions from world-renowned scientists who address some of the most fundamental research issues in overcoming friction. Superlubricity reviews the latest methods and materials in this area of research that are aimed at removing friction in nano-to-micro scale machines and large scale engineering components. Insight is also given into the atomic-scale origins of friction in general and superlubricity while other chapters focus on experimental and practical aspects or impacts of superlubricity that will be very useful for broader industrial community.* Reviews the latest fundamental research in superlubricity today* Presents 'state-of-the-art' methods, materials, and experimental techniques* Latest developments in tribomaterials, coatings, and lubricants providing superlubricity
Author: Kurt W. Kolasinski Publisher: John Wiley & Sons ISBN: 9780470997819 Category : Science Languages : en Pages : 503
Book Description
Surface chemistry is an essential and developing area of physical chemistry and one that has become increasingly interdisciplinary. The Second Edition of Surface Science: Foundations of Catalysis and Nanoscience has been fully revised and updated to reflect all the latest developments in the field and now includes an extensive discussion about nanoparticle growth and the quantum confinement effects in nanoscale systems. Two new chapters have been added and discuss The Liquid/Solid Interface and Non-Thermal Reactions, and Photon and Electron Stimulated Chemistry and Atom Manipulation. There are now many more worked examples included throughout to help students develop their problem-solving skills.
Author: Thomas James Whittles Publisher: Springer ISBN: 3319916653 Category : Technology & Engineering Languages : en Pages : 388
Book Description
This book examines the electronic structure of earth-abundant and environmentally friendly materials for use as absorber layers within photovoltaic cells. The corroboration between high-quality photoemission measurements and density of states calculations yields valuable insights into why these materials have demonstrated poor device efficiencies in the vast literature cited. The book shows how the materials’ underlying electronic structures affect their properties, and how the band positions make them unsuitable for use with established solar cell technologies. After explaining these poor efficiencies, the book offers alternative window layer materials to improve the use of these absorbers. The power of photoemission and interpretation of the data in terms of factors generally overlooked in the literature, such as the materials’ oxidation and phase impurity, is demonstrated. Representing a unique reference guide, the book will be of considerable interest and value to members of the photoemission community engaged in solar cell research, and to a wider materials science audience as well.
Author: Yip-Wah Chung
Author: Yip-Wah Chung
Author: John T. Yates Jr.
Author: Siegfried Hofmann
Author: Stephen F. Tonkin
Author: Sebastian Schlücker
Author: John F. Watts
Author: Tze-jer Chuang
Author: Ali Erdemir
Author: Kurt W. Kolasinski
Author: Thomas James Whittles