Author: Joint Committee on Chemical Analysis by Powder Diffraction MethodsPublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 704
Book Description
X-ray Powder Data File, Sets 1-5 (revised): Organic
Author: Joint Committee on Chemical Analysis by Powder Diffraction MethodsPublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 704
Book Description
Powder Diffraction File: Sets 6-33. [Section II] Inorganic. [v.1] Sets 1-5
![Powder Diffraction File: Sets 6-33. [Section II] Inorganic. [v.1] Sets 1-5 PDF](https://books.google.com/books/content/images/frontcover/wE2Bp3AkyuAC?fife=w80-h100)
Author: American Society for Testing and MaterialsPublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 1104
Book Description
Powder Diffraction File
Author: Publisher:
ISBN:
Category : Chemistry, Inorganic
Languages : en
Pages : 1104
Book Description
Powder Diffraction File
Author: American Society for Testing and MaterialsPublisher:
ISBN:
Category : Chemistry, Organic
Languages : en
Pages : 704
Book Description
NBS Technical Note
Author: Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 204
Book Description
Index (organic) to the Powder Diffraction File
Author: Joint Committee on Powder Diffraction StandardsPublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 976
Book Description
X-ray Powder Data File
Author: American Society for Testing and MaterialsPublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 392
Book Description
Advances in X-Ray Analysis
Author: Gavin R. MallettPublisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Author: 
Author: