Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 454
Book Description
Includes section "Abstracts of recent scientific publications of the N.V. Philips' Gloeilampenfabrieken."
Philips Technical Review
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 454
Book Description
Includes section "Abstracts of recent scientific publications of the N.V. Philips' Gloeilampenfabrieken."
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 454
Book Description
Includes section "Abstracts of recent scientific publications of the N.V. Philips' Gloeilampenfabrieken."
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Order and Disorder
Author: Lucy Hutchinson
Publisher: Wiley-Blackwell
ISBN: 9780631220619
Category : Literary Criticism
Languages : en
Pages : 332
Book Description
Order and Disorder, the first epic poem by an Englishwoman, has never before been available in its entirety. The first five cantos were printed anonymously in 1679, but fifteen further cantos remained in manuscript, probably because they were so politically sensitive. David Norbrook, widely recognized as a leading authority on Renaissance literature and politics, has now attributed the work to the republican, Lucy Hutchison. In this prestigious scholarly volume, he provides a wealth of editorial matter, along with the first full version of Order and Disorder ever to be published.
Publisher: Wiley-Blackwell
ISBN: 9780631220619
Category : Literary Criticism
Languages : en
Pages : 332
Book Description
Order and Disorder, the first epic poem by an Englishwoman, has never before been available in its entirety. The first five cantos were printed anonymously in 1679, but fifteen further cantos remained in manuscript, probably because they were so politically sensitive. David Norbrook, widely recognized as a leading authority on Renaissance literature and politics, has now attributed the work to the republican, Lucy Hutchison. In this prestigious scholarly volume, he provides a wealth of editorial matter, along with the first full version of Order and Disorder ever to be published.
Industrial Ceramics
Author: F. Singer
Publisher: Springer
ISBN: 9401752575
Category : Science
Languages : en
Pages : 1460
Book Description
Publisher: Springer
ISBN: 9401752575
Category : Science
Languages : en
Pages : 1460
Book Description
Check List of Serials in Indonesian Libraries
Author: Indonesia. Biro Perpustakaan
Publisher:
ISBN:
Category : Libraries
Languages : en
Pages : 728
Book Description
Publisher:
ISBN:
Category : Libraries
Languages : en
Pages : 728
Book Description
Engineering Electromagnetics
Review of Civil Litigation Costs
Author: Great Britain. Ministry of Justice
Publisher: The Stationery Office
ISBN: 9780117064034
Category : Law
Languages : en
Pages : 388
Book Description
In January 2009, the then Master of the Rolls, Sir Anthony Clarke, appointed Lord Justice Jackson to lead a fundamental review of the rules and principles governing the costs of civil litigation. This report intends to establish how the costs rules operate and how they impact on the behavior of both parties and lawyers.
Publisher: The Stationery Office
ISBN: 9780117064034
Category : Law
Languages : en
Pages : 388
Book Description
In January 2009, the then Master of the Rolls, Sir Anthony Clarke, appointed Lord Justice Jackson to lead a fundamental review of the rules and principles governing the costs of civil litigation. This report intends to establish how the costs rules operate and how they impact on the behavior of both parties and lawyers.
Clinical Doppler Ultrasound
Author: Paul L. P. Allan
Publisher: Elsevier Health Sciences
ISBN: 0443101167
Category : Medical
Languages : en
Pages : 381
Book Description
Provides a guide to techniques and their major applications and role in patient management. The major applications of Doppler ultrasound, including examination techniques and the interpretation of results, are discussed in an accessible, reader-friendly manner. Color and halftone illustrations. Chapters are color-coded.
Publisher: Elsevier Health Sciences
ISBN: 0443101167
Category : Medical
Languages : en
Pages : 381
Book Description
Provides a guide to techniques and their major applications and role in patient management. The major applications of Doppler ultrasound, including examination techniques and the interpretation of results, are discussed in an accessible, reader-friendly manner. Color and halftone illustrations. Chapters are color-coded.
Guide to Microforms in Print
The Physics of Quantum Mechanics
Author: James Binney
Publisher: Oxford University Press, USA
ISBN: 0199688575
Category : Science
Languages : en
Pages : 408
Book Description
This title gives students a good understanding of how quantum mechanics describes the material world. The text stresses the continuity between the quantum world and the classical world, which is merely an approximation to the quantum world.
Publisher: Oxford University Press, USA
ISBN: 0199688575
Category : Science
Languages : en
Pages : 408
Book Description
This title gives students a good understanding of how quantum mechanics describes the material world. The text stresses the continuity between the quantum world and the classical world, which is merely an approximation to the quantum world.