Author: Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1050
Book Description
Scientific and Technical Aerospace Reports
Author: X-Ray Diffraction
Author: Oliver H. SeeckPublisher: CRC Press
ISBN: 9814303607
Category : Science
Languages : en
Pages : 438
Book Description
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Scientific and Technical Aerospace Reports
Author: Storage Ring-Based Inverse Compton X-ray Sources
Author: Benedikt Sebastian GüntherPublisher: Springer Nature
ISBN: 3031177428
Category : Science
Languages : en
Pages : 356
Book Description
This thesis presents research on novel laboratory-scale synchrotron X-ray sources based on inverse Compton scattering and applications of their X-ray radiation using the Munich Compact Light Source (MuCLS) as an example. It provides an introduction to the theory of this laser-electron interaction, laser resonators and X-ray interactions with matter. On this basis, upgrades to the laser system including the development of a new laser optic, X-ray beam stabilisation and two techniques for fast X-ray energy switching of inverse Compton sources are presented. On the application side, the beamline, designed and developed for the inverse Compton X-ray source at the MuCLS, is described before various techniques and applications are demonstrated at this laboratory-scale synchrotron X-ray facility. Among them are K-edge subtraction imaging, X-ray phase contrast imaging and X-ray absorption spectroscopy. Additionally, a new X-ray microscopy technique, called full-field structured-illumination super-resolution X-ray transmission microscopy, is presented. Apart from research conducted at the MuCLS, this thesis contains an in-depth overview on the state of the art of the various types of inverse Compton X-ray sources that have been realised so far. Accordingly, this thesis may serve as a guide and reference work for researchers working with inverse Compton X-ray sources as well as future users of such devices.
X-Rays and Extreme Ultraviolet Radiation
Author: David AttwoodPublisher: Cambridge University Press
ISBN: 1316810666
Category : Technology & Engineering
Languages : en
Pages :
Book Description
With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.
X-Ray Microscopy II
Author: David SayrePublisher: Springer
ISBN: 3540392467
Category : Science
Languages : en
Pages : 464
Book Description
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.
Advances in Imaging and Electron Physics
Author: Publisher: Academic Press
ISBN: 032391506X
Category : Technology & Engineering
Languages : en
Pages : 280
Book Description
Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series - Updated release includes the latest information on the Coulomb Interactions in Charged Particle Beams
Energy Research Abstracts
Author: Government reports annual index
Author: Government Reports Annual Index: Keyword A-L
Author: Publisher:
ISBN:
Category : Government reports announcements & index
Languages : en
Pages : 1336
Book Description