Author: Publisher:
ISBN: 9781504429498
Category :
Languages : en
Pages :
Book Description
P1450.6/D1.6, Jun 2005 - IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
Author: Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
Author: Publisher:
ISBN:
Category : Computer hardware description languages
Languages : en
Pages :
Book Description
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL).
Author: Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) Replaced by Approved Draft
Author: Standard Test Interface Language (STIL) for Digital Test Vector Data
Author: Publisher:
ISBN: 9782831893372
Category : Computer hardware description languages
Languages : en
Pages : 143
Book Description
Standard Test Interface Language (STIL) for Digital Test Vector Data
Author: British Standards Institute StaffPublisher:
ISBN: 9780580593130
Category :
Languages : en
Pages : 144
Book Description
Programming languages, Interfaces (data processing), Information exchange, Data transfer, Data processing, Automatic, Test equipment, Computer applications, Simulation, Data representation, Vectors (mathematics)
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Author: Publisher:
ISBN: 9780738116464
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
IEEE Standard Interface Test Language (STIL) for digital test vectors : approved 18 March 1999 ; IEEE-SA standard boards
Author: [Anonymus AC02915398]Publisher:
ISBN: 9780738116471
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Author: 
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