Author: Etienne Bres
Publisher:
ISBN:
Category :
Languages : fr
Pages : 238

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Book Description

Author: Earl J. Kirkland
Publisher: Springer
ISBN: 9780306459368
Category : Science
Languages : en
Pages : 0

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Book Description
Image simulation has become a common tool in HREM (High Resolution Electron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is difficult for beginners to get started in this field. The principle method of image simulation has come to be known as simply the multislice method. This book attempts to bring the diverse information on image simulation together into one place and to provide a background on how to use the multislice method to simulate high resolution images in both conventional and scanning transmission electron microscopy. The main goals of image simulation include understanding the microscope and interpreting high resolution information in the recorded micrographs. This book contains sections on the theory of image formation and simulation as well as a more practical introduction on how to use the multislice method on real specimens. Also included with this book is a CD-ROM with working programs to perform image simulation. The source code as well as the executable code for IBM-PC and Apple Macintosh computers is included. Although the programs may not have a very elegant user interface by today's standards (simple command line dialog), the source code should be very portable to a variety of different computers. It has been compiled and run on Mac's, PC's and several different types of UNIX computers.

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Book Description

Author: Debbie Stokes
Publisher: John Wiley & Sons
ISBN: 0470065400
Category : Science
Languages : en
Pages : 247

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Book Description
Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk

Author: John Wilfred Orton
Publisher:
ISBN: 0199695822
Category : Science
Languages : en
Pages : 529

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Book Description
The book is a history of Molecular Beam Epitaxy (MBE) as applied to the growth of semiconductor thin films (note that it does not cover the subject of metal thin films). It begins by examining the origins of MBE, first of all looking at the nature of molecular beams and considering their application to fundamental physics, to the development of nuclear magnetic resonance and to the invention of the microwave MASER. It shows how molecular beams of silane (SiH4) were used to study the nucleation of silicon films on a silicon substrate and how such studies were extended to compound semiconductors such as GaAs. From such surface studies in ultra-high vacuum the technique developed into a method of growing high quality single crystal films of a wide range of semiconductors. Comparing this with earlier evaporation methods of deposition and with other epitaxial deposition methods such as liquid phase and vapour phase epitaxy (LPE and VPE). The text describes the development of MBE machines from the early 'home-made' variety to that of commercial equipment and show how MBE was gradually refined to produce high quality films with atomic dimensions. This was much aided by the use of various in-situ surface analysis techniques, such as reflection high energy electron diffraction (RHEED) and mass spectrometry, a feature unique to MBE. It looks at various modified versions of the basic MBE process, then proceed to describe their application to the growth of so-called 'low-dimensional structures' (LDS) based on ultra-thin heterostructure films with thickness of order a few molecular monolayers. Further chapters cover the growth of a wide range of different compounds and describe their application to fundamental physics and to the fabrication of electronic and opto-electronic devices. The authors study the historical development of all these aspects and emphasise both the (often unexpected) manner of their discovery and development and the unique features which MBE brings to the growth of extremely complex structures with monolayer accuracy.

Author: Nicholas Ayache
Publisher: Springer
ISBN: 9783642334535
Category : Computers
Languages : en
Pages : 645

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Book Description
The three-volume set LNCS 7510, 7511, and 7512 constitutes the refereed proceedings of the 15th International Conference on Medical Image Computing and Computer-Assisted Intervention, MICCAI 2012, held in Nice, France, in October 2012. Based on rigorous peer reviews, the program committee carefully selected 252 revised papers from 781 submissions for presentation in three volumes. The third volume includes 79 papers organized in topical sections on diffusion imaging: from acquisition to tractography; image acquisition, segmentation and recognition; image registration; neuroimage analysis; analysis of microscopic and optical images; image segmentation; diffusion weighted imaging; computer-aided diagnosis and planning; and microscopic image analysis.

Author: Ahmed Belasri
Publisher: Springer Nature
ISBN: 9811554447
Category : Technology & Engineering
Languages : en
Pages : 659

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Book Description
This book highlights peer reviewed articles from the 1st International Conference on Renewable Energy and Energy Conversion, ICREEC 2019, held at Oran in Algeria. It presents recent advances, brings together researchers and professionals in the area and presents a platform to exchange ideas and establish opportunities for a sustainable future. Topics covered in this proceedings, but not limited to, are photovoltaic systems, bioenergy, laser and plasma technology, fluid and flow for energy, software for energy and impact of energy on the environment.

Author: Pacific Forestry Centre
Publisher:
ISBN: 9780662426233
Category : Forest management
Languages : en
Pages : 304

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Book Description
"This book presents a synthesis of published information on mountain pine beetle (Dendroctonus ponderosae Hopkins [Coleoptera: Scolytidae]) biology and management with an emphasis on lodgepole pine (Pinus contorta Dougl. ex Loud. var. latifolia Engelm.) forests of western Canada. Intended as a reference for researchers as well as forest managers, the book covers three main subject areas: mountain pine beetle biology, management, and socioeconomic concerns. The chapters on biology cover taxonomy, life history and habits, distribution, insect-host tree interactions, development and survival, epidemiology, and outbreak history. The management section covers management strategy, survey and detection, proactive and preventive management, and decision support tools. The chapters on socioeconomic aspects include an economic examination of management programs and the utilization of post-beetle salvage timber in solid wood, panelboard, pulp and paper products."--Publisher's description.

Author: OECD Nuclear Energy Agency
Publisher: Nuclear Energy Agency
ISBN:
Category : Science
Languages : en
Pages : 788

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Book Description

Author: Ernst Bauer
Publisher: Springer
ISBN: 1493909355
Category : Technology & Engineering
Languages : en
Pages : 513

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Book Description
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.