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Author: John C. Stover Publisher: SPIE-International Society for Optical Engineering ISBN: 9780819492517 Category : Light Languages : en Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: John C. Stover Publisher: SPIE-International Society for Optical Engineering ISBN: 9780819492517 Category : Light Languages : en Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: Craig F. Bohren Publisher: John Wiley & Sons ISBN: 3527618163 Category : Science Languages : en Pages : 544
Book Description
Absorption and Scattering of Light by Small Particles Treating absorption and scattering in equal measure, this self-contained, interdisciplinary study examines and illustrates how small particles absorb and scatter light. The authors emphasize that any discussion of the optical behavior of small particles is inseparable from a full understanding of the optical behavior of the parent material-bulk matter. To divorce one concept from the other is to render any study on scattering theory seriously incomplete. Special features and important topics covered in this book include: * Classical theories of optical properties based on idealized models * Measurements for three representative materials: magnesium oxide, aluminum, and water * An extensive discussion of electromagnetic theory * Numerous exact and approximate solutions to various scattering problems * Examples and applications from physics, astrophysics, atmospheric physics, and biophysics * Some 500 references emphasizing work done since Kerker's 1969 work on scattering theory * Computer programs for calculating scattering by spheres, coated spheres, and infinite cylinders
Author: Peter W Barber Publisher: World Scientific ISBN: 9814507431 Category : Technology & Engineering Languages : en Pages : 273
Book Description
This book presents the separation-of-variables and T-matrix methods of calculating the scattering of electromagnetic waves by particles. Analytical details and computer programs are provided for determining the scattering and absorption characteristics of the finite-thickness slab, infinite circular cylinder (normal incidence), general axisymmetric particle, and sphere.The computer programs are designed to generate data that is easy to graph and visualize, and test cases in the book illustrate the capabilities of the programs. The connection between the theory and the computer programs is reinforced by references in the computer programs to equations in the text. This cross-referencing will help the reader understand the computer programs, and, if necessary, modify them for other purposes.
Author: Benjamin Chu Publisher: Academic Press ISBN: 032316188X Category : Technology & Engineering Languages : en Pages : 354
Book Description
Laser Light Scattering: Basic Principles and Practice, Second Edition deals with the technical aspects of laser light scattering, including the basic principles and practice. Topics covered include light scattering theory, optical mixing spectrometry, photon correlation spectroscopy, and interferometry. Experimental methods and methods of data analysis are also described. This book is comprised of eight chapters and begins with a discussion on the interrelationship between laser light scattering and other types of scattering techniques that use X-rays and neutrons, with particular reference to momentum and energy transfers as well as time-averaged and time-dependent scattered intensity. The spectrum of scattered light and a single-particle approach to time-averaged scattered intensity are considered. The following chapters focus on photoelectric detection of the scattered electric field; optical mixing spectrometers; basic equations for photon correlation spectroscopy; and the principles of Fabry-Perot interferometry. The pertinent features of the experimental aspects of laser light scattering are also outlined, together with the Laplace inversion problem. The final chapter examines polymer molecular-weight distributions in relation to particle sizing. This monograph will be of interest to physicists.
Author: Kuo-Nan Liou Publisher: Cambridge University Press ISBN: 0521889162 Category : Science Languages : en Pages : 461
Book Description
This volume outlines the fundamentals and applications of light scattering, absorption and polarization processes involving ice crystals.
Author: Adrian Doicu Publisher: Springer ISBN: 3540336974 Category : Science Languages : en Pages : 333
Book Description
This book develops the theory of the null-field method (also called T-matrix method), covering almost all aspects and current applications. This book also incorporates FORTRAN programs and simulation results. Worked examples of the application of the FORTRAN programs show readers how to adapt or modify the programs for their specific application.
Author: I. L. Fabelinskii Publisher: Springer Science & Business Media ISBN: 1468417401 Category : Science Languages : en Pages : 638
Book Description
The development of the laser and the subsequent expansion of research in the field of molecular scattering of light tend to ob scure the vast literature that accumulated on this subject during th'e last fifty years. The appearance of the Russian edition of Dr. Fabelinskii's book, just as this laser-induced explosion in light-scattering research took place, served to put the earlier work in its proper perspective. However, the book lacked any appreci able coverage of the laser work. Fortunately, Dr. Fabelinskii has taken advantage of the time between the appearance of the Russian text and its translation into English to expand greatly the sections devoted to areas in which laser research has made such interesting and vital additions, At the same time, revisions and insertions have been made throughout the text, so that the English translation is virtually a second edition of this useful work. The translator wishes to express his thanks here to Dr. Fa belinskii for making the revisions, corrections, and additions availahle for the English language work. He is also grateful to his graduate student, Mark B. Moffett, who prepared the index and who, during the course of its preparation, made a large number of crit ical comments and corrections that have enhanced the quality of the final product.
Author: Milton Kerker Publisher: Elsevier ISBN: 1483225240 Category : Science Languages : en Pages : 685
Book Description
The Scattering of Light and other Electromagnetic Radiation covers the theory of electromagnetic scattering and its practical applications to light scattering. This book is divided into 10 chapters that particularly present examples of practical applications to light scattering from colloidal and macromolecular systems. The opening chapters survey the physical concept of electromagnetic waves and optics. The subsequent chapters deal with the theory of scattering by spheres and infinitely long cylinders. These topics are followed by discussions on the application of light scattering to the determination of the size distribution of colloidal particles. The last chapters are devoted to the Rayleigh-Debye scattering and the scattering by liquids, as well as the concept of anisotropy. These chapters also describe the effect upon light scattering of partial orientation of anisotropic particles in electrical and magnetic fields and in viscous flow. This book is of value to physical chemists and physical chemistry researchers, teachers, and students.
Author: Wolfgang Schärtl Publisher: Springer Science & Business Media ISBN: 3540719512 Category : Technology & Engineering Languages : en Pages : 200
Book Description
Light scattering is a very powerful method for characterizing the structure of polymers and nanoparticles in solution. As part of the Springer Laboratory series, this book provides a simple-to-read and illustrative textbook probing the seemingly very complicated topic of light scattering from polymers and nanoparticles in dilute solution, and goes further to cover some of the latest technical developments in experimental light scattering.
Author: John C. Stover
Author: John C. Stover
Author: Rémi Carminati
Author: Craig F. Bohren
Author: Peter W Barber
Author: Benjamin Chu
Author: Kuo-Nan Liou
Author: Adrian Doicu
Author: I. L. Fabelinskii
Author: Milton Kerker
Author: Wolfgang Schärtl