Optical Properties of Dielectric Films PDF Download
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Author: Rolf E. Hummel Publisher: CRC Press ISBN: 9780849324840 Category : Science Languages : en Pages : 378
Book Description
Thin Films for Optical Coating emphasizes the applications of thin films, deposition of thin films, and thin film characterization. Unlike monographs on this subject, this book presents the views of many expert authors. Individual chapters span a wide arc of topics within this field of study. The book offers an introduction to usual and unusual applications of optical thin films, treating in a more qualitative way general topics such as anticounterfeiting coatings, decorative coatings, light switches, contrast enhancement coatings, multiplexers, optical memories, and more. Contributors review thin film media for optical data storage, UV broadband and narrow-band filters, and optically active thin film coatings. Ion beam sputtering and magnetron sputtering deposition methods are described in detail. Characterization techniques are provided, including Raman spectroscopy and absorption measurements. The book also offers theories on light scattering of thin dielectric films and the electromagnetic properties of nanocermet thin films. This reference incorporates recent research by the individual authors with their views of current developments in their respective fields. Of particular interest to the reader will be an assessment of the historical developments of thin film physics written by one of the fathers of thin film technology, Professor M. Auwärter.
Author: Dick Bedeaux Publisher: World Scientific ISBN: 1783261420 Category : Science Languages : en Pages : 446
Book Description
This invaluable book represents a substantial body of work describing the theory of the optical properties of thin island films and rough surfaces. In both cases the feature sizes are small compared to the wavelength of light. The approach is extremely rigorous and theoretically very thorough.The reflection, transmission and absorption of light are described. Computer programs that provide exact solutions for theoretical properties of thin island films have recently become available, and this makes the book of great practical use.The early chapters provide a comprehensive theoretical framework. The electromagnetic properties of a boundary layer are described in terms of excess of the electric current, charge density and electric and magnetic fields, in Chapters 2 and 3. The reflection, transmission and absorption of light are described in Chapter 4. Chapters 5 to 10 present a spectrum of specific island films. Spheres and spheroids with the axis of revolution normal to the substrate are treated. The region of contact is finite in both cases and the bottom of the island planar. Both the low coverage limit and finite coverage are discussed. In all cases the electromagnetic interaction with the image charge distribution in the substrate is taken into account rigorously. In Chapter 11 the theory is applied to stratified layers, reproducing well-known results in a simple and straightforward manner. The Green functions for the general solution of the wave equation are given in Chapter 12 and used in Chapter 13 in the derivation of the symmetry relations. The last chapter deals with rough surfaces.
Author: O. S. Heavens Publisher: Courier Corporation ISBN: 0486669246 Category : Science Languages : en Pages : 276
Book Description
Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.
Author: K. Vedam Publisher: Academic Press ISBN: 1483288935 Category : Science Languages : en Pages : 345
Book Description
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.