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Author: Betty Prince Publisher: John Wiley & Sons ISBN: 0471986100 Category : Technology & Engineering Languages : en Pages : 371
Book Description
Die Bandbreite und Zugriffszeit traditioneller DRAMs reicht nicht mehr aus, um mit der Geschwindigkeit moderner Mikroprozessoren Schritt zu halten. Daher baut man verstärkt Hochleistungs-Speicherchips, deren neue Generation das Thema dieses Buches bildet. Die Autorin, eine international anerkannte Spezialistin, diskutiert objektiv und herstellerunabhängig Technologien wie DDR DRAMs, CiDDR DRAMs, SL=DRAM, Direct Rambus, SSTL Interfaces und MP-DRAMs. Der aktuellste verfügbare Beitrag zu einem enorm wichtigen Thema! (12/98)
Author: Betty Prince Publisher: John Wiley & Sons ISBN: 0471986100 Category : Technology & Engineering Languages : en Pages : 371
Book Description
Die Bandbreite und Zugriffszeit traditioneller DRAMs reicht nicht mehr aus, um mit der Geschwindigkeit moderner Mikroprozessoren Schritt zu halten. Daher baut man verstärkt Hochleistungs-Speicherchips, deren neue Generation das Thema dieses Buches bildet. Die Autorin, eine international anerkannte Spezialistin, diskutiert objektiv und herstellerunabhängig Technologien wie DDR DRAMs, CiDDR DRAMs, SL=DRAM, Direct Rambus, SSTL Interfaces und MP-DRAMs. Der aktuellste verfügbare Beitrag zu einem enorm wichtigen Thema! (12/98)
Author: Kiyoo Itoh Publisher: Springer Science & Business Media ISBN: 3662044781 Category : Technology & Engineering Languages : en Pages : 504
Book Description
A systematic description of microelectronic device design. Topics range from the basics to low-power and ultralow-voltage designs, subthreshold current reduction, memory subsystem designs for modern DRAMs, and various on-chip supply-voltage conversion techniques. It also covers process and device issues as well as design issues relating to systems, circuits, devices and processes, such as signal-to-noise and redundancy.
Author: Stephen R. Schach Publisher: McGraw-Hill Companies ISBN: Category : Computers Languages : en Pages : 658
Book Description
The Universal Modeling Language (UML) has become an industry standard in software engineering. In this text, it is used for object-oriented analysis and design as well as when diagrams depict objects and their interrelationships.
Author: Souvik Mahapatra Publisher: Springer ISBN: 8132225082 Category : Technology & Engineering Languages : en Pages : 282
Book Description
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to access pre-existing and newly generated gate insulator traps responsible for BTI. The book provides a consistent physical framework for NBTI and PBTI respectively for p- and n- channel MOSFETs, consisting of trap generation and trapping. A physics-based compact model is presented to estimate measured BTI degradation in planar Si MOSFETs having differently processed SiON and HKMG gate insulators, in planar SiGe MOSFETs and also in Si FinFETs. The contents also include a detailed investigation of the gate insulator process dependence of BTI in differently processed SiON and HKMG MOSFETs. The book then goes on to discuss Reaction-Diffusion (RD) model to estimate generation of new traps for DC and AC NBTI stress and Transient Trap Occupancy Model (TTOM) to estimate charge occupancy of generated traps and their contribution to BTI degradation. Finally, a comprehensive NBTI modeling framework including TTOM enabled RD model and hole trapping to predict time evolution of BTI degradation and recovery during and after DC stress for different stress and recovery biases and temperature, during consecutive arbitrary stress and recovery cycles and during AC stress at different frequency and duty cycle. The contents of this book should prove useful to academia and professionals alike.
Author: Ashok K. Sharma Publisher: Wiley-IEEE Press ISBN: 9780780310001 Category : Technology & Engineering Languages : en Pages : 480
Book Description
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
Author: DON LANCASTER Publisher: Gulf Professional Publishing ISBN: 9780750699433 Category : Computers Languages : en Pages : 534
Book Description
The CMOS Cookbook contains all you need to know to understand and successfully use CMOS (Complementary Metal-Oxide Semiconductor) integrated circuits. Written in a "cookbook" format that requires little math, this practical, user-oriented book covers all the basics for working with digital logic and many of its end appilations. Whether you're a newcomver to logic and electronics or a senior design engineer, you'll find CMOS Cookbook and its examples helpful as a self-learning guide, a reference handbook, a project-idea book, or a text for teaching others digital logic at the high school through university levels. In the pages of this revised edition, you'll discover: *What CMOS is, who makes it, and how the basic transistors, inverters, and logic and transmission gates work *CMOS usage rules, power-suppy examples, and information on breadboards, state testing, tools, and interfacing *Discussions of the latest CMOS devices and sub-families, including the 74C, 74HC, and 74HCT series that streamline TTL and CMOS interfacing *An in-depth look at multivibrators - including astable, monostable, and bistable - and linear techniques *Clocked-logic designs and the extensive applications of JK and D-type flip-flops *A helpful appendix featuring a TTL-to-CMOS conversion chart
Author: S. A. Money Publisher: Academic Press ISBN: 1483268705 Category : Computers Languages : en Pages : 323
Book Description
Microprocessor Data Book, Second Edition focuses on the available types of microprocessors and microcomputers, including description of internal architecture, instruction set, main electrical data, and package details of these instruments. The book first elaborates on 4-bit and 8-bit microprocessors and microcomputers. Discussions focus on Advanced Micro Devices Am2900 series, Hitachi HMCS40 series, Motorola MC6801 and MC6803, Motorola MC6809 series, Rockwell R6500/1 series, and RCA 1800 series. The text then examines 16-bit and 32-bit microprocessors and microcomputers. Topics include Intel 80286 microprocessor, Motorola 68010, Texas Instruments TMS9980, Zilog Z8000 series, Motorola 68020 processor, and National 32032. The manuscript takes a look at other support devices, peripheral device controllers, and serial I/O devices, including Motorola MC6850 ACIA, Texas Instruments TMS9902 ACC, Thomson EFCIS EF9365/6, and floppy disk controllers. The publication is a valuable source of information for computer science experts and researchers interested in microprocessors and microcomputers.
Author: Betty Prince
Author: Betty Prince
Author: Texas Instruments Incorporated
Author: Kiyoo Itoh
Author: Stephen R. Schach
Author: Walter A. Triebel
Author: Souvik Mahapatra
Author: Ashok K. Sharma
Author: DON LANCASTER
Author: 
Author: S. A. Money