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Author: Luigi Cocco Publisher: BoD – Books on Demand ISBN: 9535105841 Category : Technology & Engineering Languages : en Pages : 474
Book Description
"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.
Author: Luigi Cocco Publisher: BoD – Books on Demand ISBN: 9535105841 Category : Technology & Engineering Languages : en Pages : 474
Book Description
"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.
Author: Oleh Velychko Publisher: BoD – Books on Demand ISBN: 1803550481 Category : Technology & Engineering Languages : en Pages : 152
Book Description
In the modern era of scientific and technological development, the role of measurements and metrology in scientific research is becoming more and more important due to the increase in the testing of various products. Moreover, requirements for the accuracy and reliability of measurement results are increasing significantly and their ranges are expanding. Improving measurement accuracy allows us to identify the shortcomings of certain technological processes and either eliminate them or reduce their influence. This leads to better-quality products and contributes to saving energy and other resources, as well as raw materials and materials. This book discusses relevant aspects of practical metrological activity to establish traceability of measurements while increasing their accuracy and reliability. It also presents procedures for the calibration and testing of measuring instruments.
Author: Valeria Teppati Publisher: Cambridge University Press ISBN: 1107036410 Category : Technology & Engineering Languages : en Pages : 475
Book Description
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Author: Alessandro Ferrero Publisher: John Wiley & Sons ISBN: 1119021332 Category : Technology & Engineering Languages : en Pages : 398
Book Description
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life Provides a unique methodological approach to understanding modern measurements Important methods and devices are presented in a synthetic and easy-to-understand way Includes end-of-chapter exercises and solutions
Author: Clive Parini Publisher: IET ISBN: 1849195609 Category : Technology & Engineering Languages : en Pages : 800
Book Description
This volume provides a comprehensive introduction and explanation of both the theory and practice of all forms of modern antenna measurements, electromagnetic theory, antenna coupling, compact range measurements, near-field antenna measurements, mobile and body-centric antenna measurements.
Author: Ewa Bulska Publisher: Springer ISBN: 3319992066 Category : Science Languages : en Pages : 201
Book Description
In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.
Author: Dinesh K. Aswal Publisher: Springer Nature ISBN: 9819920744 Category : Technology & Engineering Languages : en Pages : 2504
Book Description
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
Author: Paul Hockett Publisher: Morgan & Claypool Publishers ISBN: 1681746875 Category : Science Languages : en Pages : 204
Book Description
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Author: Luigi Cocco
Author: Luigi Cocco
Author: Oleh Velychko
Author: Lowis D'Aguilar Jackson
Author: Valeria Teppati
Author: Alessandro Ferrero
Author: Clive Parini
Author: Komyo Kariya
Author: Ewa Bulska
Author: Dinesh K. Aswal
Author: Paul Hockett