MODELING OF TIP-SAMPLE INTERACTIONS IN ATOMIC FORCE MICROSCOPY: CALCULATION AND INTERPRETATION OF IMAGES PDF Download

Author: Hao Tang
Publisher:
ISBN:
Category :
Languages : en
Pages : 252

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Book Description
LES EXPERIENCES DE MICROSCOPIE A FORCE ATOMIQUE (AFM) SONT ENCORE MAL COMPRISES, AUSSI BIEN POUR L'ORIGINE DES RUGOSITES ET L'ORDRE DE GRANDEUR DES FORCES MESUREES QUE POUR L'INTERPRETATION STRUCTURALE DES IMAGES. POUR MIEUX COMPRENDRE LES PHENOMENES LORS D'UNE IMAGERIE, NOUS AVONS COMMENCE PAR UNE CLASSIFICATION DES DIFFERENTES METHODES DE MODELISATION EXISTANTES, AVANT DE PORTER NOTRE CHOIX SUR LA MECANIQUE MOLECULAIRE QUI PERMET UNE DESCRIPTION PAR DES POTENTIELS CHIMIQUES DE LA JONCTION POINTE-SURFACE EN LA CONSIDERANT COMME UNE SUPERMOLECULE. LA PRISE EN COMPTE DES DEFORMATIONS A PERMIS DE REPRODUIRE LES IMAGES DE TROIS SUBSTRATS DE NATURE TRES DIFFERENTE: LE GRAPHITE, LE MICA (MUSCOVITE) ET LE CHLORURE DE SODIUM. CEPENDANT, CETTE METHODE RESTE INSUFFISANTE POUR UNE EVALUATION CORRECTE DE LA RUGOSITE ET DES FORCES MESUREES MALGRE SES POSSIBILITES TANT POUR L'ETUDE DES SURFACES PLANES QUE POUR L'ETUDE DES DEFAUTS COMME LES MARCHES OU LES LACUNES. UN NOUVEAU MODELE EST DONC PROPOSE, BASE SUR LE CONCEPT DIT DE JELLIUM DEFORMABLE DANS LEQUEL LES INTERACTIONS POINTE-SURFACE DE LA JONCTION SONT DECRITES PAR LES LOIS DU MILIEU CONTINU POUR LES PARTIES LOIN DE LA ZONE DE CONTACT ET PAR LA MECANIQUE MOLECULAIRE POUR LES PARTIES DANS LA ZONE DE CONTACT. UNE PREMIERE APPLICATION DE CE MODELE MONTRE UN BON ACCORD DE LA RUGOSITE ET L'ORDRE DE GRANDEUR DES FORCES CALCULEES AVEC LES VALEURS EXPERIMENTALES. PAR QUELQUES EXEMPLES IL EST MONTRE QUE L'ON PEUT ENVISAGER DESORMAIS D'UTILISER CETTE APPROCHE POUR DES ETUDES PLUS AVANCEES COMME LA MANIPULATION D'ATOMES, L'IMAGERIE DE MOLECULES ADSORBEES, LA RECONNAISSANCE D'UN SITE ACTIF D'UNE PROTEINE OU LE CALCUL SIMULTANE D'UNE IMAGE AFM ET STM

Author: Sergei N. Magonov
Publisher: John Wiley & Sons
ISBN: 3527615105
Category : Technology & Engineering
Languages : en
Pages : 335

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Book Description
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

Author: S. Morita
Publisher: Springer Science & Business Media
ISBN: 9783540431176
Category : Mathematics
Languages : en
Pages : 468

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Book Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Author: Vahid Vahdat
Publisher:
ISBN:
Category :
Languages : en
Pages : 145

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Book Description

Author: Ricardo García
Publisher: John Wiley & Sons
ISBN: 352764394X
Category : Technology & Engineering
Languages : en
Pages : 212

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Book Description
Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.

Author: S. Morita
Publisher: Springer Science & Business Media
ISBN: 3642560199
Category : Technology & Engineering
Languages : en
Pages : 448

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Book Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Author: Peter W. Hawkes
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561

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Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Author: Umberto Celano
Publisher: Springer
ISBN: 3030156125
Category : Science
Languages : en
Pages : 408

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Book Description
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Author: Arturo M. Baró
Publisher: John Wiley & Sons
ISBN: 3527327584
Category : Science
Languages : en
Pages : 385

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Book Description
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM

Author: Zhen Liu
Publisher:
ISBN:
Category :
Languages : en
Pages : 167

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Book Description
In the last three decades, atomic force microscopy (AFM) has evolved to be one of the most powerful and versatile tools enabling nanoscale analysis and exploration in many areas such as material science, physics, chemistry, tribology and nanomanufacturing. Especially, there has been intensively increasing interest in applying AFM in biological researches due to its unmatched capability of studying biological samples like protein, DNA molecule and live cell in their native physiological environment with high resolution. Dynamic AFM is a widely used AFM mode because it greatly reduces the lateral force between tip and sample through intermittent tip-sample contact during scanning and it is insensitive to thermal drift of cantilever. However, there is a major drawback in conventional dynamic AFM which inhibits further innovation and full development of its potentials: its capability of high speed scanning with high spatial resolution retained is limited by several fundamental issues involving the tapping dynamics of cantilever, the instrument hardware and the amplitude modulation principle of dynamic AFM operation. In this dissertation, the fundamental aspects in modeling, actuation, sensing and control of AFM are investigated. Accurate multi-mode tip position reconstruction, high speed and high precision active tip motion control, precise sensing and direct control of dynamic interaction force are realized to overcome the limitations in conventional dynamic AFM and to enable the potential of high speed and high resolution dynamic AFM imaging. As scanning speed increases, cantilever's responses of high dynamic modes can be excited noticeably by tip-sample interaction force. These responses are distorted in the optical lever measurement system due to measurement sensitivity difference among distinct dynamic modes, which leads to tip position measurement error and therefore compromises image resolution. In this research work, cantilever dynamics of multiple dynamic modes is modeled and multi-mode measurement sensitivity calibration is realized. Based on the multi-mode cantilever model and the calibrated measurement sensitivities, two approaches, i.e., the modal projection filtering method and the multi-mode state estimation method, are developed to reconstruct actual tip position from the distorted optical lever measurement signal with sub-Angstrom level accuracy to help retain image resolution during high speed scanning.