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Author: S.B. Newcomb Publisher: CRC Press ISBN: 1040292496 Category : Technology & Engineering Languages : en Pages : 609
Book Description
Microscopy of Oxidation: the proceedings of the Second International Conference Held at Selwyn College, University of Cambridge, on 29-31 1993.
Author: S.B. Newcomb Publisher: CRC Press ISBN: 1040292496 Category : Technology & Engineering Languages : en Pages : 609
Book Description
Microscopy of Oxidation: the proceedings of the Second International Conference Held at Selwyn College, University of Cambridge, on 29-31 1993.
Author: G.W. Lorimer Publisher: CRC Press ISBN: 1000946797 Category : Technology & Engineering Languages : en Pages : 439
Book Description
Microscopy of Oxidation: the proceedings of the Second International Conference Held at Selwyn College, University of Cambridge, in 1991.
Author: Neil Birks Publisher: Cambridge University Press ISBN: 1139449095 Category : Technology & Engineering Languages : en Pages : 5
Book Description
A straightforward treatment describing the oxidation processes of metals and alloys at elevated temperatures. This 2006 second edition retains the fundamental theory but incorporates advances made in understanding degradation phenomena. The first half provides an authoritative introduction to the basic principles, covering thermodynamics and mechanisms of high temperature corrosion of metals and alloys. The latter half extends the discussion to oxidation processes in complex systems, from reactions in mixed environments to protective techniques, including coatings and atmosphere control. The authors provide a logical and expert treatment of the subject, producing a revised edition that will be a comprehensive guide to material scientists and engineers requiring an understanding of this elementary process.
Author: Mario Lanza Publisher: John Wiley & Sons ISBN: 3527340912 Category : Science Languages : en Pages : 382
Book Description
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Author: Peter W. Hawkes Publisher: Springer Nature ISBN: 3030000699 Category : Technology & Engineering Languages : en Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: C. J. Kiely Publisher: CRC Press ISBN: 9780750305778 Category : Science Languages : en Pages : 1320
Book Description
Electron Microscopy and Analysis 1999 provides an overview of recent developments and outlines opportunities for future research in electron microscopy. The book presents the wide-ranging applications of these techniques in materials science, metallurgy, and surface science. It is an authoritative reference for academics and researchers working in materials science, instrumentation, electron optics, and condensed matter physics.
Author: Leonard Ernest Samuels Publisher: ASM International ISBN: 9781615032174 Category : Technology & Engineering Languages : en Pages : 520
Book Description
Containing over 1,200 representative micrographs and the information and explanatory text that makes them really useful, including composition, condition, etchant, magnification, and more than 100 graphs and tables, this 'how to' book not only gives everyday working examples, but also discusses the relationship between the constitution, metallurgy, and microstructure of various carbon steel products. Contents: Nomenclature of Phases and Constituents; Phase Transformations; Low-Carbon Irons and Steels; Annealing and Normalizing; Spheroidization and Graphitization; Austenitization; Transformation of Austenite; Tempering of Martensite; Welding; Surface Oxidation, Decarburation and Oxidation Scaling; Glossary of Terms; EtchingMethods; ConversionTables; Index.
Author: S.B. Newcomb
Author: S.B. Newcomb
Author: G.W. Lorimer
Author: Gordon Tatlock
Author: S. B. Newcomb
Author: Neil Birks
Author: Mario Lanza
Author: Peter W. Hawkes
Author: C. J. Kiely
Author: Leonard Ernest Samuels
Author: Brian D. Ross