Author: Ruste
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Microanalyse X par sonde électronique - Applications et développements
Microanalyse X par Sonde Electronique
Author:
Publisher: Ed. Techniques Ingénieur
ISBN:
Category :
Languages : fr
Pages : 15
Book Description
Publisher: Ed. Techniques Ingénieur
ISBN:
Category :
Languages : fr
Pages : 15
Book Description
Microanalyse X par sonde électronique - Principe et instrumentation
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Author: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : en
Pages : 624
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : en
Pages : 624
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Colloque sur la Microanalyse à Sonde Electronique
Author: Colloque sur la Microanalyse à Sonde Electronique. 1973, Bellevue, Seine-et-Oise
Publisher:
ISBN:
Category :
Languages : fr
Pages : 136
Book Description
Publisher:
ISBN:
Category :
Languages : fr
Pages : 136
Book Description
La microanalyse par sonde électronique : application à l'étude de la mise en valeur d'une magnétite titanifère de la région de Magpie, province de Québec
Author: Laguitton, D. (Daniel)
Publisher: 1973 [c1976]
ISBN:
Category :
Languages : fr
Pages : 452
Book Description
Publisher: 1973 [c1976]
ISBN:
Category :
Languages : fr
Pages : 452
Book Description
Microanalyse par sonde électronique: spectrométrie de rayons X
Optique des rayons X et microanalyse
Author: Raymond Castaing
Publisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 716
Book Description
Publisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 716
Book Description
Microanalyse par sonde électronique
Author: Association Nationale de la Recherche Technique (Francia)
Publisher:
ISBN: 9782900195116
Category :
Languages : fr
Pages :
Book Description
Publisher:
ISBN: 9782900195116
Category :
Languages : fr
Pages :
Book Description
Microanalyse X par sonde électronique
Author: Michel Fialin
Publisher:
ISBN: 9782900195307
Category :
Languages : fr
Pages :
Book Description
Publisher:
ISBN: 9782900195307
Category :
Languages : fr
Pages :
Book Description