Author:
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 0
Book Description
Materials and Electron Device Processing
Materials and Electron Device Processing
Materials and Electron Device Processing
Author: American Society for Testing and Materials
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Materials and Electron Device Processing
Author: ASTM International
Publisher:
ISBN: 9780803161177
Category : Electron tubes
Languages : en
Pages : 283
Book Description
Publisher:
ISBN: 9780803161177
Category : Electron tubes
Languages : en
Pages : 283
Book Description
Materials and Electron Device Processing
Author: American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 300
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 300
Book Description
Materials and electron device processing
Author: American Society for Testing and Materials. Committee F-1 on Materials for Electron Tubes and Semiconductor Devices
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 283
Book Description
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 283
Book Description
Reliability and Failure of Electronic Materials and Devices
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Materials and Processes of Electron Devices
Author: Max Knoll
Publisher: Springer Science & Business Media
ISBN: 3642459366
Category : Technology & Engineering
Languages : de
Pages : 504
Book Description
This bookis intended to be of assistance to the physicist or engineer concerned with designing and building electron devices such as high-vacuum transmitter- or amplifier tubes, gas- or vapor-filled rectifiers, thyratrons, X-ray or luminescent tubes, glow or incandescent lamps, Geiger- or ionization counters, vacuum photo cells, photoconductive cells, selenium-, germanium- or silicon rectifiers or trans istors. For this purpose, extensive information is required concerning the compo sition, behavior and handling of materials as well as a thorough knowledge of high-vacuum technique necessary for processing electron devices after their assembly. The text covers the preparation and working of materials used in these devices; the finishing methods for vacuum tubes (especially degassing, pumping and getter procedures); and different production steps of solid state devices. This book contains about 2300 references indicated in the text by the author's name and reference number. At the end of each chapter the references themselves are listed alphabetically by the author's name and with the title sometimes abbreviated. In accordance with the purpose of the book, "first" publications are quoted only when they contain up-to-date-knowledge of the subject in question. Patents are treated as references. The quotation of a patent gives only a hint of the technical details described there. Mentioning, or not mentioning, a patent does not imply a statement concerning its importance or validity or warning against imitation. Expired patents are named in addition to ones still valid.
Publisher: Springer Science & Business Media
ISBN: 3642459366
Category : Technology & Engineering
Languages : de
Pages : 504
Book Description
This bookis intended to be of assistance to the physicist or engineer concerned with designing and building electron devices such as high-vacuum transmitter- or amplifier tubes, gas- or vapor-filled rectifiers, thyratrons, X-ray or luminescent tubes, glow or incandescent lamps, Geiger- or ionization counters, vacuum photo cells, photoconductive cells, selenium-, germanium- or silicon rectifiers or trans istors. For this purpose, extensive information is required concerning the compo sition, behavior and handling of materials as well as a thorough knowledge of high-vacuum technique necessary for processing electron devices after their assembly. The text covers the preparation and working of materials used in these devices; the finishing methods for vacuum tubes (especially degassing, pumping and getter procedures); and different production steps of solid state devices. This book contains about 2300 references indicated in the text by the author's name and reference number. At the end of each chapter the references themselves are listed alphabetically by the author's name and with the title sometimes abbreviated. In accordance with the purpose of the book, "first" publications are quoted only when they contain up-to-date-knowledge of the subject in question. Patents are treated as references. The quotation of a patent gives only a hint of the technical details described there. Mentioning, or not mentioning, a patent does not imply a statement concerning its importance or validity or warning against imitation. Expired patents are named in addition to ones still valid.
Materials and Electron Device Processing
Materials and Electron Device Processing
Author: ASTM. Committee F1 on Materials for Electron Tubes and Semiconductor Devices
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description