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Author: C.H. Stapper Publisher: Springer Science & Business Media ISBN: 1475799578 Category : Technology & Engineering Languages : en Pages : 313
Book Description
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Author: M. Bushnell Publisher: Springer Science & Business Media ISBN: 0306470403 Category : Technology & Engineering Languages : en Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author: Behrooz Parhami Publisher: Springer Science & Business Media ISBN: 0306469642 Category : Business & Economics Languages : en Pages : 512
Book Description
THE CONTEXT OF PARALLEL PROCESSING The field of digital computer architecture has grown explosively in the past two decades. Through a steady stream of experimental research, tool-building efforts, and theoretical studies, the design of an instruction-set architecture, once considered an art, has been transformed into one of the most quantitative branches of computer technology. At the same time, better understanding of various forms of concurrency, from standard pipelining to massive parallelism, and invention of architectural structures to support a reasonably efficient and user-friendly programming model for such systems, has allowed hardware performance to continue its exponential growth. This trend is expected to continue in the near future. This explosive growth, linked with the expectation that performance will continue its exponential rise with each new generation of hardware and that (in stark contrast to software) computer hardware will function correctly as soon as it comes off the assembly line, has its down side. It has led to unprecedented hardware complexity and almost intolerable dev- opment costs. The challenge facing current and future computer designers is to institute simplicity where we now have complexity; to use fundamental theories being developed in this area to gain performance and ease-of-use benefits from simpler circuits; to understand the interplay between technological capabilities and limitations, on the one hand, and design decisions based on user and application requirements on the other.
Author: John P. Uyemura Publisher: Springer Science & Business Media ISBN: 0306475294 Category : Technology & Engineering Languages : en Pages : 542
Book Description
This is an up-to-date treatment of the analysis and design of CMOS integrated digital logic circuits. The self-contained book covers all of the important digital circuit design styles found in modern CMOS chips, emphasizing solving design problems using the various logic styles available in CMOS.
Author: Mostafa I Abd-el-barr Publisher: World Scientific ISBN: 190897978X Category : Computers Languages : en Pages : 463
Book Description
Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a
Author: Israel Koren Publisher: Springer Science & Business Media ISBN: 1461567998 Category : Computers Languages : en Pages : 362
Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Author: Israel Koren Publisher: Morgan Kaufmann ISBN: 0128181060 Category : Computers Languages : en Pages : 418
Book Description
Fault-Tolerant Systems, Second Edition, is the first book on fault tolerance design utilizing a systems approach to both hardware and software. No other text takes this approach or offers the comprehensive and up-to-date treatment that Koren and Krishna provide. The book comprehensively covers the design of fault-tolerant hardware and software, use of fault-tolerance techniques to improve manufacturing yields, and design and analysis of networks. Incorporating case studies that highlight more than ten different computer systems with fault-tolerance techniques implemented in their design, the book includes critical material on methods to protect against threats to encryption subsystems used for security purposes. The text's updated content will help students and practitioners in electrical and computer engineering and computer science learn how to design reliable computing systems, and how to analyze fault-tolerant computing systems. - Delivers the first book on fault tolerance design with a systems approach - Offers comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Features fully updated content plus new chapters on failure mechanisms and fault-tolerance in cyber-physical systems - Provides a complete ancillary package, including an on-line solutions manual for instructors and PowerPoint slides
Author: Bruno Ciciani
Author: Bruno Ciciani
Author: C.H. Stapper
Author: M. Bushnell
Author: IEEE computer society
Author: Behrooz Parhami
Author: John P. Uyemura
Author: Mostafa I Abd-el-barr
Author: Israel Koren
Author: 
Author: Israel Koren